Inventor · disambiguated record
Jocelyn Blair
Also filed as: BLAIR JOCELYN
1 granted patent·1 pending application·0 citations·filing 2022–2025
14Inventor score
Technology areasG06N
Files withD2S INC2
Top patents by PatentIndex Score
2 records- 0172US2025292389A1Method for computational metrology and inspection for patterns to be manufactured on a substrateD2S INC·Filed 2025·Application pending·0 cites
- 0268US12340495B2Method for computational metrology and inspection for patterns to be manufactured on a substrateD2S INC·Filed 2022·Granted Jun 24, 2025·0 cites·11 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →