Inventor · disambiguated record
Katsuyuki Uematsu
Also filed as: UEMATSU KATSUYUKI
16 granted patents·5 pending applications·81 citations·filing 2002–2024
91Inventor score
Files withFUJI ELECTRIC CO LTD11FUJI ELEC DEVICE TECH CO LTD3RICOH CO LTD3FUJI ELECTRIC SYSTEMS CO LTD1NISHIKAWA MUTSUO1
Top patents by PatentIndex Score
21 records- 0184US10330552B2Pressure sensor device including-fluorinated gel protective member disposed on a protective filmFUJI ELECTRIC CO LTD·Filed 2015·Granted Jun 25, 2019·5 cites·4 claims
- 0283US11094517B2Method and device for preparing measurement sample for MALDI mass spectrometry, measurement sample for MALDI mass spectrometry, MALDI mass spectrometry method, and non-transitory recording medium for preparing measurement sample for MALDI mass spectrometryRICOH CO LTD·Filed 2020·Granted Aug 17, 2021·1 cites·12 claims
- 0381US7274543B2Over-voltage protection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted Sep 25, 2007·29 cites·4 claims
- 0479US9200974B2Semiconductor pressure sensor device and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2014·Granted Dec 1, 2015·5 cites·16 claims
- 0570US11532472B2Mass spectrometryRICOH CO LTD·Filed 2021·Granted Dec 20, 2022·0 cites·15 claims
- 0667US6962081B2Semiconductor physical quantity sensor with improved noise resistanceFUJI ELECTRIC CO LTD·Filed 2002·Granted Nov 8, 2005·14 cites·13 claims
- 0766US2025146723A1Temperature adjustment apparatus and sensing systemFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 0863US11404261B2Method, device, and base for preparing measurement sample for MALDI mass spectrometryRICOH CO LTD·Filed 2021·Granted Aug 2, 2022·0 cites·14 claims
- 0960US7046013B2Open-circuit failure detection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted May 16, 2006·9 cites·18 claims
- 1058US7525389B2Signal amplifier circuit with a limiting voltage deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Apr 28, 2009·4 cites·11 claims
- 1154US7119657B2Polysilicon resistor semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2002·Granted Oct 10, 2006·6 cites·12 claims
- 1254US6680512B2Semiconductor device having an integral protection circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 20, 2004·6 cites·18 claims
- 1345US8237505B2Signal amplification circuitNISHIKAWA MUTSUO·Filed 2009·Granted Aug 7, 2012·2 cites·11 claims
- 1445US2006244101A1Semiconductor apparatus and physical quantity sensing apparatusFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Application pending·0 cites
- 1543US9857782B2Output value correction method for physical quantity sensor apparatus, output correction method for physical quantity sensor, physical quantity sensor apparatus and output value correction apparatus for physical quantity sensorFUJI ELECTRIC CO LTD·Filed 2012·Granted Jan 2, 2018·0 cites·15 claims
- 1642US2010109647A1Physical quantity sensing apparatus having an internal circuit, a filter circuit having resistors, power supply, grounding, and output pads, with the length and width of wiring between the output or power supply pad and the internal circuit set so that the resistance of resistors and the parasitic resistance component of the wiring satisfy a certain relational expressionFUJI ELEC DEVICE TECH CO LTD·Filed 2010·Application pending·0 cites
- 1738US10126145B2Physical quantity sensor device and method of adjusting physical quantity sensor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Nov 13, 2018·0 cites·7 claims
- 1838US7772658B2Semiconductor device and method of manufacturing sameFUJI ELECTRIC SYSTEMS CO LTD·Filed 2007·Granted Aug 10, 2010·0 cites·15 claims
- 1937US6684371B2Layout of semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 27, 2004·0 cites·1 claims
- 2034US2002149984A1Semiconductor physical quantity sensing deviceFiled 2002·Application pending·0 cites
- 2134US2002186518A1Overvoltage protection circuitFiled 2002·Application pending·0 cites
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