Inventor · disambiguated record
Mutsuo Nishikawa
Also filed as: NISHIKAWA MUTSUO
36 granted patents·4 pending applications·193 citations·filing 1996–2023
97Inventor score
Top patents by PatentIndex Score
40 records- 0185US8884385B2Physical quantity sensor with son structure, and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2012·Granted Nov 11, 2014·7 cites·5 claims
- 0281US7274543B2Over-voltage protection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted Sep 25, 2007·29 cites·4 claims
- 0379US9200974B2Semiconductor pressure sensor device and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2014·Granted Dec 1, 2015·5 cites·16 claims
- 0479US6332359B1Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 1999·Granted Dec 25, 2001·27 cites·18 claims
- 0574US11422049B2Sensor device configured to reduce output errors due to temperature characteristicsFUJI ELECTRIC CO LTD·Filed 2020·Granted Aug 23, 2022·1 cites·20 claims
- 0674US6494092B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Dec 17, 2002·10 cites·5 claims
- 0771US6632697B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Oct 14, 2003·9 cites·12 claims
- 0869US10393607B2Semiconductor sensing deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Aug 27, 2019·2 cites·10 claims
- 0969US7180798B2Semiconductor physical quantity sensing deviceFUJI ELECTRIC CO LTD·Filed 2003·Granted Feb 20, 2007·12 cites·21 claims
- 1068US12504340B2Pressure detection device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2023·Granted Dec 23, 2025·0 cites·20 claims
- 1168US12109958B2In-vehicle semiconductor circuit and semiconductor circuitFUJI ELECTRIC CO LTD·Filed 2021·Granted Oct 8, 2024·0 cites·20 claims
- 1267US6962081B2Semiconductor physical quantity sensor with improved noise resistanceFUJI ELECTRIC CO LTD·Filed 2002·Granted Nov 8, 2005·14 cites·13 claims
- 1367US6526827B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Mar 4, 2003·7 cites·8 claims
- 1464US6446507B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Sep 10, 2002·6 cites·4 claims
- 1562US8934309B2Semiconductor integrated circuit and semiconductor physical quantity sensor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Jan 13, 2015·2 cites·6 claims
- 1662US8304847B2Semiconductor pressure sensorKAMINAGA TOSHIAKI·Filed 2005·Granted Nov 6, 2012·4 cites·11 claims
- 1760US7046013B2Open-circuit failure detection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted May 16, 2006·9 cites·18 claims
- 1858US9245851B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Granted Jan 26, 2016·1 cites·15 claims
- 1958US7525389B2Signal amplifier circuit with a limiting voltage deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Apr 28, 2009·4 cites·11 claims
- 2056US6483283B2Semiconductor dynamic quantity-sensor and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2001·Granted Nov 19, 2002·9 cites·11 claims
- 2154US7119657B2Polysilicon resistor semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2002·Granted Oct 10, 2006·6 cites·12 claims
- 2254US6680512B2Semiconductor device having an integral protection circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 20, 2004·6 cites·18 claims
- 2350US10962430B2Pressure sensorFUJI ELECTRIC CO LTD·Filed 2018·Granted Mar 30, 2021·0 cites·12 claims
- 2450US6564634B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted May 20, 2003·2 cites·7 claims
- 2548US5827967ASemiconductor accelerometer including strain gauges forming a wheatstone bridge and diffusion resistorsFUJI ELECTRIC CO LTD·Filed 1996·Granted Oct 27, 1998·12 cites·9 claims
- 2648US2006238186A1Semiconductor device and temperature detection method using the sameFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Application pending·0 cites
- 2745US8237505B2Signal amplification circuitNISHIKAWA MUTSUO·Filed 2009·Granted Aug 7, 2012·2 cites·11 claims
- 2844US2014330539A1Semiconductor integrated circuit and semiconductor physical quantity sensor deviceFUJI ELECTRIC CO LTD·Filed 2014·Application pending·0 cites
- 2943US9857782B2Output value correction method for physical quantity sensor apparatus, output correction method for physical quantity sensor, physical quantity sensor apparatus and output value correction apparatus for physical quantity sensorFUJI ELECTRIC CO LTD·Filed 2012·Granted Jan 2, 2018·0 cites·15 claims
- 3043US8183700B2Semiconductor device having alignment mark and its manufacturing methodNISHIKAWA MUTSUO·Filed 2008·Granted May 22, 2012·0 cites·20 claims
- 3139US10197464B2Semiconductor physical quantity sensor having filter circuits for blocking electromagnetic wave noiseFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 5, 2019·0 cites·14 claims
- 3239US6281033B1Semiconductor dynamic quantity-sensor and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 1999·Granted Aug 28, 2001·7 cites·11 claims
- 3338US10126145B2Physical quantity sensor device and method of adjusting physical quantity sensor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Nov 13, 2018·0 cites·7 claims
- 3437US6684371B2Layout of semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 27, 2004·0 cites·1 claims
- 3535US9666288B2Semiconductor integrated circuit device having electrically rewriteable read-dedicated memoryFUJI ELECTRIC CO LTD·Filed 2016·Granted May 30, 2017·0 cites·13 claims
- 3634US2002149984A1Semiconductor physical quantity sensing deviceFiled 2002·Application pending·0 cites
- 3734US2002186518A1Overvoltage protection circuitFiled 2002·Application pending·0 cites
- 3833US10381827B2Semiconductor integrated circuit deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Aug 13, 2019·0 cites·11 claims
- 3931US9431065B2Semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2015·Granted Aug 30, 2016·0 cites·7 claims
- 4031US9331684B2Semiconductor device for sensing physical quantityFUJI ELECTRIC CO LTD·Filed 2015·Granted May 3, 2016·0 cites·12 claims
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