Inventor · disambiguated record
Sungho Kang
Also filed as: KANG SUNGHO · KANG SUNGHO (RYAN)
46 granted patents·12 pending applications·641 citations·filing 1994–2025
97Inventor score
Files withSAMSUNG ELECTRONICS CO LTD14UNIV YONSEI IACF8KANG SUNGHO5UIF UNIV INDUSTRY FOUNDATION YONSEI UNIV5HALLA CLIMATE CONTROL CORP4
Top patents by PatentIndex Score
58 records- 0198US11387196B2On-chip security circuit for detecting and protecting against invasive attacksUNIV YONSEI IACF·Filed 2020·Granted Jul 12, 2022·6 cites·19 claims
- 0296US9362137B2Plasma treating apparatus, substrate treating method, and method of manufacturing a semiconductor deviceKANG SUNGHO·Filed 2015·Granted Jun 7, 2016·417 cites·19 claims
- 0394US12321086B2Camera moduleSAMSUNG ELECTRO MECH·Filed 2022·Granted Jun 3, 2025·2 cites·20 claims
- 0493US9855821B2Heat pump system for vehicleHALLA VISTEON CLIMATE CONTROL·Filed 2013·Granted Jan 2, 2018·14 cites·15 claims
- 0592US10643810B2Zero power plasmonic microelectromechanical deviceUNIV NORTHEASTERN·Filed 2016·Granted May 5, 2020·7 cites·24 claims
- 0691US11567132B2Scan apparatus capable of fault diagnosis and scan chain fault diagnosis methodUIF UNIV INDUSTRY FOUNDATION YONSEI UNIV·Filed 2022·Granted Jan 31, 2023·3 cites·16 claims
- 0789US11557449B2Zero power plasmonic microelectromechanical deviceUNIV NORTHEASTERN·Filed 2020·Granted Jan 17, 2023·2 cites·12 claims
- 0889US9829237B2Heat pump system for vehicle and method of controlling the sameHANON SYSTEMS·Filed 2015·Granted Nov 28, 2017·5 cites·7 claims
- 0988US10001525B2Semiconductor device and method for testing the sameUNIV YONSEI IACF·Filed 2014·Granted Jun 19, 2018·7 cites·15 claims
- 1080US7055591B2Air conditioner for vehicleHALLA CLIMATE CONTROL CORP·Filed 2005·Granted Jun 6, 2006·9 cites·6 claims
- 1178US10157152B2Semiconductor device including a global buffer shared by a plurality of memory controllersSK HYNIX INC·Filed 2015·Granted Dec 18, 2018·3 cites·11 claims
- 1277US7540322B2Air conditioner for vehicleHALLA CLIMATE CONTROL CORP·Filed 2005·Granted Jun 2, 2009·7 cites·8 claims
- 1376US10403555B2Three dimensional integrated circuit having redundant through silicon via base on rotatable cubeUNIV YONSEI IACF·Filed 2018·Granted Sep 3, 2019·2 cites·10 claims
- 1476US9947290B2Multi embedded timing controller, display panel, and computer system having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Apr 17, 2018·3 cites·17 claims
- 1576US5600787AMethod and data processing system for verifying circuit test vectorsMOTOROLA INC·Filed 1994·Granted Feb 4, 1997·42 cites·25 claims
- 1673US12000891B2Scan correlation-aware scan cluster reordering method and apparatus for low-power testingUIF UNIV INDUSTRY FOUNDATION YONSEI UNIV·Filed 2022·Granted Jun 4, 2024·0 cites·8 claims
- 1773US8854614B2Methods of thermally treating a semiconductor waferSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Oct 7, 2014·4 cites·15 claims
- 1873US7937954B2Cooling and heating cabinet device of rear seat for vehicles using thermoelectric elementHALLA CLIMATE CONTROL CORP·Filed 2006·Granted May 10, 2011·17 cites·15 claims
- 1973US7428681B2Method and apparatus for reducing number of transitions generated by linear feedback shift registerUNIV YONSEI SEOUL·Filed 2005·Granted Sep 23, 2008·10 cites·5 claims
- 2072US8948966B2Heat pump system for vehicle and method of controlling the sameKIM TAEEUN·Filed 2013·Granted Feb 3, 2015·5 cites·12 claims
- 2171US10043799B2Method of manufacturing semiconductor device using surface treatment and semiconductor device manufactured by the methodSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 7, 2018·1 cites·15 claims
- 2270US10170398B2Three-dimensional integrated circuitUNIV YONSEI IACF·Filed 2017·Granted Jan 1, 2019·3 cites·10 claims
- 2370US8601330B2Device and method for repair analysisJEONG WOO-SIK·Filed 2010·Granted Dec 3, 2013·5 cites·17 claims
- 2469US9180754B2Heat pump system for vehicleWANG YOONHO·Filed 2011·Granted Nov 10, 2015·4 cites·14 claims
- 2569US5583787AMethod and data processing system for determining electrical circuit path delaysMOTOROLA INC·Filed 1994·Granted Dec 10, 1996·31 cites·28 claims
- 2668US12405303B2Scan chain security circuit and driving method thereofUIF UNIV INDUSTRY FOUNDATION YONSEI UNIV·Filed 2023·Granted Sep 2, 2025·0 cites·11 claims
- 2768US9248719B2Dual zone type air conditioner for vehicles and method of controlling the sameKANG SUNGHO·Filed 2009·Granted Feb 2, 2016·6 cites·3 claims
- 2867US9672128B2Multi-core device, test device, and method of diagnosing failureINDUSTRY-ACADEMIC COOPERATION FOUNDATION YONSEI UNIV·Filed 2014·Granted Jun 6, 2017·3 cites·26 claims
- 2965US8432758B2Device and method for storing error information of memoryJEONG WOO-SIK·Filed 2010·Granted Apr 30, 2013·4 cites·17 claims
- 3064US2025226268A1Method of repairing through-electrodes, repair device performing the same and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 3163US2025327861A1Circuit self test apparatus and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 3262US7607316B2Air conditioner for vehicleHALLA CLIMATE CONTROL CORP·Filed 2007·Granted Oct 27, 2009·4 cites·11 claims
- 3361US12055438B2Sensor and method using bi-stable digitizing micromechanical switches for analog measurement of input signalsUNIV NORTHEASTERN·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 3461US9230051B2Method of generating voltage island for 3D many-core chip multiprocessorUNIV YONSEI IACF·Filed 2014·Granted Jan 5, 2016·1 cites·11 claims
- 3560US12283529B2Method of repairing through-electrodes, repair device performing the same and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 22, 2025·0 cites·13 claims
- 3658US9576840B2Method of manufacturing semiconductor device using surface treatment and semiconductor device manufactured by the methodSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 21, 2017·0 cites·20 claims
- 3758US9012179B2Method for mass-producing antifreeze protein derived from polar yeastKIM HAKJUN·Filed 2011·Granted Apr 21, 2015·1 cites·4 claims
- 3857US2024168362A1Lens driving apparatus and camera module including the sameSAMSUNG ELECTRO MECH·Filed 2023·Application pending·0 cites
- 3956US2013227973A1Heat pump system for vehicle and method of controlling the sameKANG SUNGHO·Filed 2013·Application pending·0 cites
- 4054US12169145B2Zero power micromechanical switch-based sensing and monitoring systemUNIV NORTHEASTERN·Filed 2020·Granted Dec 17, 2024·0 cites·20 claims
- 4153US2025006286A1Non-linear memory failure analysis method and memory test apparatusUIF UNIV INDUSTRY FOUNDATION YONSEI UNIV·Filed 2024·Application pending·0 cites
- 4253US2025094269A1Apparatus and method for pre-analyzing memory fault informationUIF UNIV INDUSTRY FOUNDATION YONSEI UNIV·Filed 2024·Application pending·0 cites
- 4351US11531277B2Extreme ultraviolet (EUV) mask inspection system, a load-lock chamber included therein, and a method for inspecting an EUV mask using the EUV mask inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 20, 2022·0 cites·20 claims
- 4451US11430137B2Electronic device and control method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Aug 30, 2022·0 cites·15 claims
- 4549US11755904B2Method and device for controlling data input and output of fully connected networkSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Sep 12, 2023·0 cites·15 claims
- 4648US12001954B2Method of performing learning of deep neural network and apparatus thereofSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 4, 2024·0 cites·20 claims
- 4748US11386973B2Method and apparatus for built in redundancy analysis with dynamic fault reconfigurationUNIV YONSEI IACF·Filed 2020·Granted Jul 12, 2022·0 cites·17 claims
- 4848US2023070785A1Semiconductor device including through-silicon via (tsv) test device and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 4948US2007137833A1Dual zone type air conditioner for vehiclesKANG SUNGHO·Filed 2006·Application pending·0 cites
- 5046US5517506AMethod and data processing system for testing circuits using boolean differencesMOTOROLA INC·Filed 1994·Granted May 14, 1996·13 cites·26 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →