Inventor · disambiguated record

Ichiro Egawa

Also filed as: EGAWA ICHIRO

1 granted patent·2 citations·filing 2005–2005

19Inventor score

Technology areasH05K

Files withSHARP KK1

Top patents by PatentIndex Score

1 record

0155US7122888B2Semiconductor device, electrical inspection method thereof, and electronic apparatus including the semiconductor deviceSHARP KK·Filed 2005·Granted Oct 17, 2006·2 cites·13 claims

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