Inventor · disambiguated record
Mutsuo Sasaki
Also filed as: SASAKI MUTSUO
10 granted patents·2 pending applications·57 citations·filing 2004–2021
85Inventor score
Top patents by PatentIndex Score
12 records- 0185US7379174B2Wafer detecting deviceTDK CORP·Filed 2005·Granted May 27, 2008·11 cites·5 claims
- 0281US7360346B2Purging system and purging method for the interior of a portable type hermetically sealed containerTDK CORP·Filed 2004·Granted Apr 22, 2008·30 cites·4 claims
- 0377US8485771B2Load port apparatus and dust exhaust method for load port apparatusSASAKI MUTSUO·Filed 2010·Granted Jul 16, 2013·6 cites·7 claims
- 0476US9786531B2Gas purge unit, load port apparatus, and installation stand for purging containerTDK CORP·Filed 2014·Granted Oct 10, 2017·3 cites·19 claims
- 0576US8251636B2Lid closing method for closed container and lid opening/closing system for closed containerSASAKI MUTSUO·Filed 2009·Granted Aug 28, 2012·6 cites·8 claims
- 0674US11049736B2Circulating EFEMTDK CORP·Filed 2019·Granted Jun 29, 2021·1 cites·9 claims
- 0767US11515177B2Circulating EFEMTDK CORP·Filed 2021·Granted Nov 29, 2022·0 cites·9 claims
- 0847US2009245981A1Closed container, lid opening and closing system for closed container, wafer transfer system, and lid closing method for closed containerTDK CORP·Filed 2009·Application pending·0 cites
- 0939US9833817B2Gas purge unit, load port apparatus, and installation stand for purging containerTDK CORP·Filed 2016·Granted Dec 5, 2017·0 cites·19 claims
- 1039US9324595B2Load port apparatus and method of detecting object to be processedSASAKI MUTSUO·Filed 2012·Granted Apr 26, 2016·0 cites·4 claims
- 1138US11135623B2Wafer transport container interior atmosphere measurement device, wafer transport container, wafer transport container interior cleaning device, and wafer transport container interior cleaning methodTDK CORP·Filed 2017·Granted Oct 5, 2021·0 cites·7 claims
- 1235US2007289928A1Plasma Exchange Waste Liquid Purification And Circulation Dialysis ApparatusJAPAN SCIENCE & TECH AGENCY·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →