Inventor · disambiguated record

Tai-Kun Lin

Also filed as: LIN TAI-KUN

1 granted patent·0 citations·filing 2003–2003

10Inventor score

Technology areasG01R

Files withTAIWAN SEMICONDUCTOR MFG1

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1 record

0124US6901342B2Test wafer usage forecast modeling methodTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted May 31, 2005·0 cites·23 claims

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