Inventor · disambiguated record
Kuniyuki Kakushima
Also filed as: KAKUSHIMA KUNIYUKI
10 granted patents·1 pending application·13 citations·filing 2005–2021
80Inventor score
Files withTOSHIBA KK4TOKYO INST TECH3SUMITOMO CHEMICAL CO2FOUND PROMOTION IND SCIENCE1PANASONIC CORP1
Top patents by PatentIndex Score
11 records- 0194US10283776B2Electrode material, and electrode layer, battery, and electrochromic device using the electrode materialTOSHIBA KK·Filed 2015·Granted May 7, 2019·8 cites·12 claims
- 0272US7825755B2Electrostatic micro actuator, electrostatic microactuator apparatus and driving method of electrostatic micro actuatorFOUND PROMOTION IND SCIENCE·Filed 2005·Granted Nov 2, 2010·3 cites·3 claims
- 0361US7800181B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2006·Granted Sep 21, 2010·2 cites·9 claims
- 0457US10964836B2Photon counting-type radiation detector and radiological inspection device using sameTOSHIBA KK·Filed 2019·Granted Mar 30, 2021·0 cites·18 claims
- 0547US11942490B2Photon counting radiation detector and radiographic inspection device using the sameTOSHIBA KK·Filed 2021·Granted Mar 26, 2024·0 cites·13 claims
- 0646US2009057739A1Ge channel device and method for fabricating ge channel deviceTOKYO INST TECH·Filed 2008·Application pending·0 cites
- 0745US12342547B2Non-volatile ferroelectric storage element and devices comprising themTOKYO INST TECH·Filed 2020·Granted Jun 24, 2025·0 cites·15 claims
- 0845US11513149B2Method for evaluating electrical defect density of semiconductor layer, and semiconductor elementSUMITOMO CHEMICAL CO·Filed 2018·Granted Nov 29, 2022·0 cites·3 claims
- 0945US9214626B2Resistance change memory deviceTOKYO INST TECH·Filed 2013·Granted Dec 15, 2015·0 cites·12 claims
- 1041US11652150B2Charge trap evaluation method and semiconductor elementSUMITOMO CHEMICAL CO·Filed 2018·Granted May 16, 2023·0 cites·16 claims
- 1141US9343536B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted May 17, 2016·0 cites·18 claims
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