Inventor · disambiguated record
Shinji Kuniyoshi
Also filed as: KUNIYOSHI SHINJI
28 granted patents·1 pending application·2,113 citations·filing 1976–2008
97Inventor score
Top patents by PatentIndex Score
29 records- 0197US4480910APattern forming apparatusHITACHI LTD·Filed 1982·Granted Nov 6, 1984·1.5k cites·15 claims
- 0292US7629807B2Electrical test probeNIHON MICRONICS KK·Filed 2005·Granted Dec 8, 2009·31 cites·9 claims
- 0391US7586321B2Electrical test probe and electrical test probe assemblyNIHON MICRONICS KK·Filed 2007·Granted Sep 8, 2009·19 cites·10 claims
- 0491US4057347AOptical exposure apparatusHITACHI LTD·Filed 1976·Granted Nov 8, 1977·56 cites·5 claims
- 0590US4441206APattern detecting apparatusHITACHI LTD·Filed 1981·Granted Apr 3, 1984·79 cites·3 claims
- 0686US4933565AMethod and apparatus for correcting defects of X-ray maskHITACHI LTD·Filed 1988·Granted Jun 12, 1990·43 cites·11 claims
- 0785US6479392B2Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Nov 12, 2002·30 cites·29 claims
- 0885US4925755AMethod of correcting defect in circuit patternHITACHI LTD·Filed 1988·Granted May 15, 1990·40 cites·6 claims
- 0982US4614432APattern detectorHITACHI LTD·Filed 1983·Granted Sep 30, 1986·32 cites·16 claims
- 1081US7586316B2Probe board mounting apparatusNIHON MICRONICS KK·Filed 2008·Granted Sep 8, 2009·12 cites·8 claims
- 1173US7667472B2Probe assembly, method of producing it and electrical connecting apparatusNIHON MICRONICS KK·Filed 2005·Granted Feb 23, 2010·7 cites·8 claims
- 1273US6633072B2Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Oct 14, 2003·13 cites·4 claims
- 1373US5115456AMask for exposing wafer with radiation and its exposing methodHITACHI LTD·Filed 1989·Granted May 19, 1992·22 cites·8 claims
- 1473US4504726APattern generatorHITACHI LTD·Filed 1981·Granted Mar 12, 1985·35 cites·5 claims
- 1572US7924038B2Probe and electrical connecting apparatus using itNIHON MICRONICS KK·Filed 2007·Granted Apr 12, 2011·7 cites·8 claims
- 1671US5497331ASemiconductor integrated circuit device fabrication method and its fabrication apparatusHITACHI LTD·Filed 1994·Granted Mar 5, 1996·46 cites·8 claims
- 1769US7736690B2Method for manufacturing an electrical test probeNIHON MICRONICS KK·Filed 2008·Granted Jun 15, 2010·6 cites·10 claims
- 1867US7679389B2Probe for electrical test and electrical connecting apparatus using itNIHON MICRONICS KK·Filed 2005·Granted Mar 16, 2010·5 cites·7 claims
- 1967US7523539B2Method of manufacturing a probeNIHON MICRONICS KK·Filed 2007·Granted Apr 28, 2009·4 cites·8 claims
- 2065US4690529AOptical exposerHITACHI LTD·Filed 1984·Granted Sep 1, 1987·29 cites·16 claims
- 2164US4737973ACrystal monochromatorHITACHI LTD·Filed 1986·Granted Apr 12, 1988·15 cites·6 claims
- 2260US7557593B2Probe for electrical test and probe assemblyNIHON MICRONICS KK·Filed 2007·Granted Jul 7, 2009·3 cites·9 claims
- 2347US4477183AAutomatic focusing apparatusHITACHI LTD·Filed 1982·Granted Oct 16, 1984·8 cites·7 claims
- 2447US4380395AReduction projection aligner systemHITACHI LTD·Filed 1980·Granted Apr 19, 1983·9 cites·5 claims
- 2542US7375037B2Fabrication method for semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted May 20, 2008·0 cites·29 claims
- 2640US4719161AMask for X-ray lithography and process for producing the sameHITACHI LTD·Filed 1986·Granted Jan 12, 1988·7 cites·6 claims
- 2737US2007018633A1Probe use in electric testNIHON MICRONICS KK·Filed 2006·Application pending·0 cites
- 2833US4964146APattern transistor mask and method of using the sameHITACHI LTD·Filed 1989·Granted Oct 16, 1990·5 cites·9 claims
- 2931US4597669APattern detectorHITACHI LTD·Filed 1983·Granted Jul 1, 1986·2 cites·3 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →