Inventor · disambiguated record
Mitsuji Ikeda
Also filed as: IKEDA MITSUJI
48 granted patents·11 pending applications·690 citations·filing 1989–2022
98Inventor score
Top patents by PatentIndex Score
59 records- 0199US6538249B1Image-formation apparatus using charged particle beams under various focus conditionsHITACHI LTD·Filed 2000·Granted Mar 25, 2003·118 cites·36 claims
- 0297US7026615B2Semiconductor inspection systemHITACHI LTD·Filed 2003·Granted Apr 11, 2006·65 cites·7 claims
- 0394US7235782B2Semiconductor inspection systemHITACHI LTD·Filed 2002·Granted Jun 26, 2007·43 cites·24 claims
- 0493US7109485B2Charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Sep 19, 2006·19 cites·5 claims
- 0590US8335397B2Charged particle beam apparatusTAKANE ATSUSHI·Filed 2008·Granted Dec 18, 2012·47 cites·7 claims
- 0690US7642514B2Charged particle beam apparatusHITACHI LTD·Filed 2007·Granted Jan 5, 2010·14 cites·8 claims
- 0790US6653633B2Charged particle beam apparatusHITACHI LTD·Filed 2003·Granted Nov 25, 2003·22 cites·7 claims
- 0889US7329868B2Charged particle beam apparatusHITACHI LTD·Filed 2006·Granted Feb 12, 2008·7 cites·3 claims
- 0987US7545977B2Image processing apparatus for analysis of pattern matching failureHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 9, 2009·10 cites·8 claims
- 1086US7230243B2Method and apparatus for measuring three-dimensional shape of specimen by using SEMHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 12, 2007·9 cites·15 claims
- 1184US6936818B2Charged particle beam apparatusHITACHI LTD·Filed 2003·Granted Aug 30, 2005·12 cites·6 claims
- 1281US7925076B2Inspection apparatus using template matching method using similarity distributionHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·13 cites·20 claims
- 1379US6850219B2Display deviceHITACHI LTD·Filed 2001·Granted Feb 1, 2005·19 cites·29 claims
- 1478US8498489B2Image inspection apparatusABE YUICHI·Filed 2009·Granted Jul 30, 2013·14 cites·6 claims
- 1578US6756590B2Shape measurement method and apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jun 29, 2004·14 cites·13 claims
- 1676US8041104B2Pattern matching apparatus and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 18, 2011·12 cites·25 claims
- 1775US8872106B2Pattern measuring apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 28, 2014·3 cites·10 claims
- 1874US5410696AMethod of processing a program by parallel processing, and a processing unit thereofHITACHI LTD·Filed 1993·Granted Apr 25, 1995·78 cites·18 claims
- 1974US5029969AOptical fiber composite insulator and method of producing the sameNGK INSULATORS LTD·Filed 1989·Granted Jul 9, 1991·24 cites·7 claims
- 2073US8885950B2Pattern matching method and pattern matching apparatusNAGATOMO WATARU·Filed 2010·Granted Nov 11, 2014·6 cites·19 claims
- 2172US7082224B2Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholdingHITACHI LTD·Filed 2005·Granted Jul 25, 2006·8 cites·14 claims
- 2271US10535129B2Pattern matching apparatus and computer programKITAZAWA MASAHIRO·Filed 2011·Granted Jan 14, 2020·4 cites·12 claims
- 2371US7652249B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 26, 2010·2 cites·22 claims
- 2470US8019164B2Apparatus, method and program product for matching with a templateHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 13, 2011·8 cites·26 claims
- 2569US8200006B2Image processing apparatus for analysis of pattern matching failureIKEDA MITSUJI·Filed 2009·Granted Jun 12, 2012·6 cites·12 claims
- 2666US8263935B2Charged particle beam apparatusTAKANE ATSUSHI·Filed 2009·Granted Sep 11, 2012·1 cites·23 claims
- 2764US11669953B2Pattern matching device and computer program for pattern matchingHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 6, 2023·1 cites·9 claims
- 2864US8285056B2Method and apparatus for computing degree of matchingTAGUCHI JUNICHI·Filed 2009·Granted Oct 9, 2012·6 cites·21 claims
- 2963US2024327775A1Training method and device for machine learning modelHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3060US12249129B2Machine learning method and information processing apparatus for machine learningHITACHI HIGH TECH CORP·Filed 2020·Granted Mar 11, 2025·0 cites·13 claims
- 3160US8953894B2Pattern matching method and image processing deviceSATO YOSHIMICHI·Filed 2009·Granted Feb 10, 2015·2 cites·12 claims
- 3259US9514526B2Device and method for detecting angle of rotation from normal position of imageTAGUCHI JUN'ICHI·Filed 2011·Granted Dec 6, 2016·2 cites·5 claims
- 3357US2007194236A1Semiconductor inspection systemTAKANE ATSUSHI·Filed 2007·Application pending·0 cites
- 3455US8305435B2Image processing system and scanning electron microscopeSATO YOSHIMICHI·Filed 2008·Granted Nov 6, 2012·2 cites·10 claims
- 3555US5329532ALogic circuit with additional circuit for carrying out delay testHITACHI LTD·Filed 1991·Granted Jul 12, 1994·18 cites·9 claims
- 3652US9183450B2Inspection apparatusABE YUICHI·Filed 2007·Granted Nov 10, 2015·1 cites·18 claims
- 3751US5136680AOptical fiber built-in type composite insulator and method for producing the sameNGK INSULATORS LTD·Filed 1991·Granted Aug 4, 1992·13 cites·1 claims
- 3851US5090793AOptical fiber composite insulatorNGK INSULATORS LTD·Filed 1991·Granted Feb 25, 1992·12 cites·1 claims
- 3950US9514528B2Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 6, 2016·0 cites·9 claims
- 4049US9141879B2Pattern matching method, image processing device, and computer programUSHIBA HIROYUKI·Filed 2011·Granted Sep 22, 2015·1 cites·14 claims
- 4149US2024177333A1Localization Apparatus and MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 4248US2022374785A1Machine Learning SystemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 4347US6249608B1Template matching image processor utilizing sub image pixel sums and sum of squares thresholdingHITACHI LTD·Filed 1997·Granted Jun 19, 2001·23 cites·11 claims
- 4446US5069525AOptical fiber built-in type composite insulator and method of producing the sameNGK INSULATORS LTD·Filed 1989·Granted Dec 3, 1991·9 cites·14 claims
- 4544US7078688B2Shape measuring device and shape measuring methodHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 18, 2006·2 cites·6 claims
- 4644US2004164243A1Shape measurement method and apparatusHITACHI HIGH TECH CORP·Filed 2004·Application pending·0 cites
- 4743US8139868B2Image processing method for determining matching position between template and search imageABE YUICHI·Filed 2008·Granted Mar 20, 2012·0 cites·10 claims
- 4843US2005219523A1Foreign matter detecting systemHITACHI LTD·Filed 2005·Application pending·0 cites
- 4941US5127083AOptical fiber built-in type composite insulator and method of producing the sameNGK INSULATORS LTD·Filed 1991·Granted Jun 30, 1992·9 cites·2 claims
- 5041US2012182415A1Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing ApparatusTOYODA YASUTAKA·Filed 2010·Application pending·0 cites
Showing the top 50 of 59 patent records by PatentIndex Score.
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