Inventor · disambiguated record
Karen Pomeranz
Also filed as: POMERANZ KAREN
1 granted patent·1 pending application·2 citations·filing 2017–2023
18Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD2
Top patents by PatentIndex Score
2 records- 0161US10275872B2Method of detecting repeating defects and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Apr 30, 2019·2 cites·20 claims
- 0246US2025124307A1Machine learning based defect examination and ranking for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →