Inventor · disambiguated record
Kyozo Fujita
Also filed as: FUJITA KYOZO
10 granted patents·4 pending applications·89 citations·filing 1998–2020
88Inventor score
Top patents by PatentIndex Score
14 records- 0190US9297818B2Sample analyzerSYSMEX CORP·Filed 2015·Granted Mar 29, 2016·5 cites·22 claims
- 0289US8329101B2Sample analyzerFUJITA KYOZO·Filed 2012·Granted Dec 11, 2012·11 cites·20 claims
- 0386US8163239B2Sample analyzerFUJITA KYOZO·Filed 2007·Granted Apr 24, 2012·13 cites·7 claims
- 0485US7931863B2Sample analyzerSYSMEX CORP·Filed 2007·Granted Apr 26, 2011·11 cites·11 claims
- 0573US7769565B2Sample measurement device, measurement information display method, and computer systemSYSMEX CORP·Filed 2007·Granted Aug 3, 2010·4 cites·16 claims
- 0670US2021063421A1Sample analyzerSYSMEX CORP·Filed 2020·Application pending·0 cites
- 0769US6181319B1Method of displaying a scattergramSYSMEX CORP·Filed 1998·Granted Jan 30, 2001·39 cites·25 claims
- 0868US10837976B2Sample analyzerSYSMEX CORP·Filed 2018·Granted Nov 17, 2020·0 cites·20 claims
- 0964US8920722B2Sample analyzer and sample analyzing methodKITAGAWA NOBUHIRO·Filed 2007·Granted Dec 30, 2014·4 cites·19 claims
- 1063US9372199B2Sample analyzerFUJINO HIROYUKI·Filed 2007·Granted Jun 21, 2016·2 cites·19 claims
- 1159US10101348B2Sample analyzerSYSMEX CORP·Filed 2016·Granted Oct 16, 2018·0 cites·20 claims
- 1252US2008050280A1Sample analyzerFUJITA KYOZO·Filed 2007·Application pending·0 cites
- 1345US2013316461A1Sample analyzer, sample container for quality control, quality control methodSYSMEX CORP·Filed 2013·Application pending·0 cites
- 1437US2013260413A1Analysis result providing system, sample analyzing system, analysis result providing apparatus, sample analysis result providing method, and storage mediumSYSMEX CORP·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →