Inventor · disambiguated record
Joo-Seok Kwak
Also filed as: KWAK JOO-SEOK
1 granted patent·2 pending applications·1 citations·filing 2004–2006
15Inventor score
Top patents by PatentIndex Score
3 records- 0147US7368933B2Method for testing standby current of semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 6, 2008·1 cites·16 claims
- 0234US2007127300A1Bun-in test method semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0329US2005276131A1Semiconductor memory device and burn-in test method thereforKIM WOO-JIN·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →