Inventor · disambiguated record

Carolyn Demain

Also filed as: DEMAIN CAROLYN

1 granted patent·71 citations·filing 1996–1996

53Inventor score

Technology areasG01B

Files withVIRGINIA SEMICONDUCTOR INC1

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1 record

0188US5754294AOptical micrometer for measuring thickness of transparent wafersVIRGINIA SEMICONDUCTOR INC·Filed 1996·Granted May 19, 1998·71 cites·22 claims

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