Inventor · disambiguated record
Shunsuke Koshihara
Also filed as: KOSHIHARA SHUNSUKE
11 granted patents·2 pending applications·98 citations·filing 1997–2018
89Inventor score
Top patents by PatentIndex Score
13 records- 0188US6713761B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Mar 30, 2004·24 cites·8 claims
- 0287US7009178B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted Mar 7, 2006·8 cites·3 claims
- 0384US5903004AEnergy dispersive X-ray analyzerHITACHI LTD·Filed 1997·Granted May 11, 1999·44 cites·11 claims
- 0481US6897445B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2003·Granted May 24, 2005·13 cites·7 claims
- 0569US7521695B2Scanning electron microscopeHITACHI LTD·Filed 2007·Granted Apr 21, 2009·2 cites·7 claims
- 0668US8180140B2Template creation method and image processor thereforYANG KYOUNGMO·Filed 2009·Granted May 15, 2012·3 cites·4 claims
- 0768US7217925B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted May 15, 2007·1 cites·7 claims
- 0865US8581187B2Method for measuring sample and measurement deviceKIJIMA MIHOKO·Filed 2009·Granted Nov 12, 2013·3 cites·13 claims
- 0958US10732512B2Image processor, method for generating pattern using self-organizing lithographic techniques and computer programHITACHI HIGH TECH CORP·Filed 2018·Granted Aug 4, 2020·0 cites·2 claims
- 1051US2015277237A1Image processor, method for generating pattern using self- organizing lithographic techniques and computer programHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1149US7834316B2Method for adjusting imaging magnification and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 16, 2010·0 cites·5 claims
- 1238US2011096309A1Method and System for Wafer InspectionIMEC·Filed 2010·Application pending·0 cites
- 1335US8552371B2Method for adjusting imaging magnification and charged particle beam apparatusSUKEGAWA SHIGEKI·Filed 2010·Granted Oct 8, 2013·0 cites·14 claims
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