Inventor · disambiguated record
Motoo Nakano
Also filed as: NAKANO MOTOO
28 granted patents·723 citations·filing 1979–2020
97Inventor score
Top patents by PatentIndex Score
28 records- 0199US4262340ASemiconductor memory deviceFUJITSU LTD·Filed 1979·Granted Apr 14, 1981·206 cites·7 claims
- 0294US11206870B1Non-combustion suction deviceJAPAN TOBACCO INC·Filed 2020·Granted Dec 28, 2021·6 cites·10 claims
- 0391US4375993AMethod of producing a semiconductor device by simultaneous multiple laser annealingFUJITSU LTD·Filed 1981·Granted Mar 8, 1983·84 cites·22 claims
- 0485US4841349ASemiconductor photodetector device with light responsive PN junction gateFUJITSU LTD·Filed 1987·Granted Jun 20, 1989·48 cites·12 claims
- 0583US4788473APlasma generating device with stepped waveguide transitionFUJITSU LTD·Filed 1987·Granted Nov 29, 1988·33 cites·25 claims
- 0676US4425700ASemiconductor device and method for manufacturing the sameFUJITSU LTD·Filed 1981·Granted Jan 17, 1984·39 cites·8 claims
- 0771US5331180APorous semiconductor light emitting deviceFUJITSU LTD·Filed 1993·Granted Jul 19, 1994·44 cites·26 claims
- 0870US4669062ATwo-tiered dynamic random access memory (DRAM) cellFUJITSU LTD·Filed 1985·Granted May 26, 1987·26 cites·14 claims
- 0968US6836668B1Portable communication apparatus with voice/character conversion direction switchNEC CORP·Filed 2000·Granted Dec 28, 2004·10 cites·5 claims
- 1067US4350536AMethod of producing dynamic random-access memory cellsFUJITSU LTD·Filed 1980·Granted Sep 21, 1982·19 cites·18 claims
- 1166US4538166ASemiconductor memory deviceFUJITSU LTD·Filed 1984·Granted Aug 27, 1985·16 cites·6 claims
- 1265US5427977AMethod for manufacturing porous semiconductor light emitting deviceFUJITSU LTD·Filed 1994·Granted Jun 27, 1995·34 cites·24 claims
- 1363US5250465AMethod of manufacturing semiconductor devicesFUJITSU LTD·Filed 1992·Granted Oct 5, 1993·41 cites·14 claims
- 1463US4806769ADisk exchangeable target mechanism with effective cooling means, for ion implantation systemFUJITSU LTD·Filed 1987·Granted Feb 21, 1989·12 cites·20 claims
- 1561US7366539B2Mobile terminal and method of obtaining web contents through the sameNEC CORP·Filed 2004·Granted Apr 29, 2008·4 cites·16 claims
- 1657US4503315ASemiconductor device with fuseFUJITSU LTD·Filed 1982·Granted Mar 5, 1985·19 cites·10 claims
- 1755US5648676ASemiconductor device with protective elementFUJITSU LTD·Filed 1996·Granted Jul 15, 1997·14 cites·12 claims
- 1852US4258077AMethod of ion implantation into a semiconductor substrate provided with an insulating filmFUJITSU LTD·Filed 1979·Granted Mar 24, 1981·12 cites·12 claims
- 1950US4727043AMethod of manufacturing a non-volatile memoryFUJITSU LTD·Filed 1985·Granted Feb 23, 1988·17 cites·2 claims
- 2042US4541074ASemiconductor device for memory cellFUJITSU LTD·Filed 1982·Granted Sep 10, 1985·4 cites·8 claims
- 2141US4275093AMethod of manufacturing insulated gate semiconductor devices by high pressure thermal oxidation with water vaporFUJITSU LTD·Filed 1979·Granted Jun 23, 1981·8 cites·10 claims
- 2238US6639941B1Radio-signal transceiverNEC CORP·Filed 1999·Granted Oct 28, 2003·11 cites·14 claims
- 2338US4461072AMethod for preparing an insulated gate field effect transistorFUJITSU LTD·Filed 1983·Granted Jul 24, 1984·6 cites·11 claims
- 2433US5670885ASemiconductor deviceFUJITSU LTD·Filed 1995·Granted Sep 23, 1997·2 cites·5 claims
- 2532US6251743B1Method of liquid treatment of microstructures comprising bendable structural membersFUJITSU LTD·Filed 1998·Granted Jun 26, 2001·2 cites·30 claims
- 2631US4454525AIGFET Having crystal orientation near (944) to minimize white ribbonFUJITSU LTD·Filed 1980·Granted Jun 12, 1984·2 cites·8 claims
- 2729US5652167AMethod of liquid treatment of micro-structures comprising structural members liable to be bentFUJITSU LTD·Filed 1993·Granted Jul 29, 1997·1 cites·8 claims
- 2828US5888633AMicro-structures having structural members capable of withstanding permanent bendFUJITSU LIMITED & FUJITSU VLSI·Filed 1997·Granted Mar 30, 1999·3 cites·21 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →