Inventor · disambiguated record
Noriyuki Igarashi
Also filed as: IGARASHI NORIYUKI
12 granted patents·2 pending applications·456 citations·filing 1985–2006
93Inventor score
Top patents by PatentIndex Score
14 records- 0192US7362117B2Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2006·Granted Apr 22, 2008·16 cites·6 claims
- 0290US6445203B1Electric device testing apparatusADVANTEST CORP·Filed 1999·Granted Sep 3, 2002·103 cites·22 claims
- 0388US6919734B2Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2003·Granted Jul 19, 2005·31 cites·7 claims
- 0484US6257319B1IC testing apparatusADVANTEST CORP·Filed 1999·Granted Jul 10, 2001·85 cites·12 claims
- 0580US6972581B2Apparatus for handling electronic components and method for controlling temperature of electronic componentsADVANTEST CORP·Filed 2003·Granted Dec 6, 2005·23 cites·14 claims
- 0678US6663092B2Holding apparatusADVANTEST CORP·Filed 2002·Granted Dec 16, 2003·22 cites·8 claims
- 0775US4691831AIC test equipmentTAKEDA RIKEN IND CO LTD·Filed 1985·Granted Sep 8, 1987·55 cites·14 claims
- 0874US5469953ATransport mechanism for IC handlersADVANTEST CORP·Filed 1994·Granted Nov 28, 1995·41 cites·2 claims
- 0968US5894217ATest handler having turn tableADVANTEST CORP·Filed 1996·Granted Apr 13, 1999·40 cites·12 claims
- 1064US5177435AIC test equipmentADVANTEST CORP·Filed 1991·Granted Jan 5, 1993·25 cites·5 claims
- 1151US2005225346A1Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2005·Application pending·0 cites
- 1242US2002109518A1Device testing apparatusADVANTEST CORP·Filed 2002·Application pending·0 cites
- 1341US5177469ASafety device for an IC handler and method for its operationADVANTEST CORP·Filed 1991·Granted Jan 5, 1993·12 cites·10 claims
- 1430US5528160ASpacing frame structure for IC handlerADVANTEST CORP·Filed 1994·Granted Jun 18, 1996·3 cites·8 claims
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