Inventor · disambiguated record
Nobuhiro Katsuma
Also filed as: KATSUMA NOBUHIRO
2 granted patents·2 pending applications·15 citations·filing 2006–2011
57Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0182US7598756B2Inspection device and inspection methodPANASONIC CORP·Filed 2006·Granted Oct 6, 2009·12 cites·8 claims
- 0260US7696767B2Inspection device and inspection methodPANASONIC CORP·Filed 2009·Granted Apr 13, 2010·3 cites·6 claims
- 0337US2009243640A1Conductive contact pin and semiconductor testing equipmentPANASONIC CORP·Filed 2009·Application pending·0 cites
- 0430US2011298487A1Semiconductor testing apparatus and testing methodKATSUMA NOBUHIRO·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →