Inventor · disambiguated record

Ben Shin

Also filed as: SHIN BEN

1 granted patent·2 citations·filing 2007–2007

19Inventor score

Technology areasG01R

Files withTAIWAN SEMICONDUCTOR MFG1

Top patents by PatentIndex Score

1 record

0148US7587293B2Semiconductor CP (circuit probe) test management system and methodTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Sep 8, 2009·2 cites·18 claims

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