Inventor · disambiguated record

Steven Biellak

Also filed as: BIELLAK STEVEN

1 granted patent·36 citations·filing 2002–2002

46Inventor score

Technology areasG01N

Files withKLA TENCOR TECH CORP1

Top patents by PatentIndex Score

1 record

0186US6922236B2Systems and methods for simultaneous or sequential multi-perspective specimen defect inspectionKLA TENCOR TECH CORP·Filed 2002·Granted Jul 26, 2005·36 cites·26 claims

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Steven Biellak — Patent Inventor | PatentIndex