Inventor · disambiguated record
James Hendrix
Also filed as: HENDRIX JAMES · HENDRIX JAMES L · HENDRIX JAMES LEE
8 granted patents·2 pending applications·99 citations·filing 1986–2006
87Inventor score
Top patents by PatentIndex Score
10 records- 0193US7304735B2Broadband wavelength selective filterKLA TENCOR TECHNOLOGIES·Filed 2005·Granted Dec 4, 2007·29 cites·24 claims
- 0273US7251036B2Beam splitter/combiner for optical metrology toolTHERMA WAVE INC·Filed 2006·Granted Jul 31, 2007·4 cites·16 claims
- 0373US5404820ANo moving parts safe & arm apparatus and method with monitoring and built-in-test for optical firing of explosive systemsUS ARMY·Filed 1994·Granted Apr 11, 1995·31 cites·17 claims
- 0465US7027158B2Beam splitter/combiner for optical meterology toolTHERMA WAVE INC·Filed 2002·Granted Apr 11, 2006·6 cites·27 claims
- 0563US6229645B1Polarization selecting optical element using a porro prism incorporating a thin film polarizer in a single elementUS ENERGY·Filed 2000·Granted May 8, 2001·9 cites·18 claims
- 0661US7154607B2Flat spectrum illumination source for optical metrologyTHERMA WAVE INC·Filed 2003·Granted Dec 26, 2006·8 cites·14 claims
- 0755US6574381B2Integrated optical switch/amplifier with modulation capabilitiesFiled 2001·Granted Jun 3, 2003·4 cites·14 claims
- 0848US4682336AQ-switched laser resonator of integral constructionHUGHES AIRCRAFT CO·Filed 1986·Granted Jul 21, 1987·8 cites·18 claims
- 0945US2004135995A1Spectroscopic ellipsometer wafer mapper for DUV to IRFiled 2003·Application pending·0 cites
- 1040US2007121104A1Techniques for reducing optical noise in metrology systemsHENDRIX JAMES L·Filed 2004·Application pending·0 cites
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