Inventor · disambiguated record

Christopher Howard Putnam

Also filed as: PUTNAM CHRISTOPHER HOWARD

1 granted patent·26 citations·filing 2002–2002

43Inventor score

Technology areasG03F

Files withNIKON PREC INC1

Top patents by PatentIndex Score

1 record

0175US6974653B2Methods for critical dimension and focus mapping using critical dimension test marksNIKON PREC INC·Filed 2002·Granted Dec 13, 2005·26 cites·30 claims

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