Inventor · disambiguated record
Shingo Furui
Also filed as: FURUI SHINGO
10 granted patents·2 pending applications·28 citations·filing 2005–2018
83Inventor score
Top patents by PatentIndex Score
12 records- 0189US7875322B2Plasma processing methodTOKYO ELECTRON LTD·Filed 2006·Granted Jan 25, 2011·16 cites·14 claims
- 0285US10295678B2X-ray detectorSHIMADZU CORP·Filed 2016·Granted May 21, 2019·4 cites·9 claims
- 0376US8034183B2Cleaning method and plasma processing methodTOKYO ELECTRON LTD·Filed 2006·Granted Oct 11, 2011·4 cites·7 claims
- 0474US10365235B2Radiation phase-contrast imaging deviceSHIMADZU CORP·Filed 2015·Granted Jul 30, 2019·3 cites·10 claims
- 0565US10393890B2X-ray imaging deviceSHIMADZU CORP·Filed 2016·Granted Aug 27, 2019·1 cites·13 claims
- 0650US10441234B2Radiation-phase-contrast imaging deviceSHIMADZU CORP·Filed 2017·Granted Oct 15, 2019·0 cites·20 claims
- 0750US8466534B2Radiation detector, and a radiographic apparatus having the sameFURUI SHINGO·Filed 2010·Granted Jun 18, 2013·0 cites·15 claims
- 0847US8564082B2Radiation detectorFURUI SHINGO·Filed 2008·Granted Oct 22, 2013·0 cites·16 claims
- 0944US10335109B2Radiation phase-contrast imaging deviceSHIMADZU CORP·Filed 2015·Granted Jul 2, 2019·0 cites·5 claims
- 1042US10276276B1Radiation phase-contrast image capturing deviceSHIMADZU CORP·Filed 2018·Granted Apr 30, 2019·0 cites·20 claims
- 1141US2009239352A1Method for producing silicon oxide film, control program thereof, recording medium and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 1240US2008093658A1Method for Nitriding Tunnel Oxide Film, Method for Manufacturing Non-Volatile Memory Device, Non-Volatile Memory Device, Control Program and Computer-Readable Recording MediumTOKYO ELECTRON LTD·Filed 2005·Application pending·0 cites
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