Inventor · disambiguated record
Ritsuo Fukaya
Also filed as: FUKAYA RITSUO
19 granted patents·4 pending applications·252 citations·filing 1996–2024
94Inventor score
Top patents by PatentIndex Score
23 records- 0196US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0295US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 0393US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 0490US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 0590US6184946B1Active matrix liquid crystal displayHITACHI LTD·Filed 1996·Granted Feb 6, 2001·88 cites·18 claims
- 0683US7745782B2Electrostatic charge measurement method, focus adjustment method, and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 29, 2010·7 cites·10 claims
- 0780US7851756B2Charged particle beam irradiation systemHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 14, 2010·4 cites·15 claims
- 0875US7659508B2Method for measuring dimensions of sample and scanning electron microscopeHITACHI LTD·Filed 2002·Granted Feb 9, 2010·11 cites·11 claims
- 0971US8969801B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2012·Granted Mar 3, 2015·2 cites·18 claims
- 1066US7566872B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 28, 2009·1 cites·8 claims
- 1166US2025189462A1Inspection flow determination device, charged particle beam device, and programHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 1261US5995187ALiquid crystal display device in-plane-switching system with counter electrode in contact with liquid crystalHITACHI LTD·Filed 1997·Granted Nov 30, 1999·25 cites·21 claims
- 1357US8080789B2Sample dimension measuring method and scanning electron microscopeNASU OSAMU·Filed 2009·Granted Dec 20, 2011·0 cites·4 claims
- 1453US12379392B2Surface analysis deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 5, 2025·0 cites·9 claims
- 1553US6300995B1Liquid crystal display device utilizing in-plane-switching system and having alignment film separating picture element electrode or counter electrode from liquid crystal layerHITACHI LTD·Filed 1999·Granted Oct 9, 2001·17 cites·11 claims
- 1650US8835844B2Sample electrification measurement method and charged particle beam apparatusEZUMI MAKOTO·Filed 2010·Granted Sep 16, 2014·0 cites·12 claims
- 1750US2011073760A1Charged Particle Beam Irradiation SystemHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 1846US8178836B2Electrostatic charge measurement method, focus adjustment method, and scanning electron microscopeISHIJIMA TATSUAKI·Filed 2010·Granted May 15, 2012·0 cites·14 claims
- 1945US8907267B2Charged particle beam deviceWANG ZHIGANG·Filed 2012·Granted Dec 9, 2014·0 cites·12 claims
- 2044US8487251B2Method for controlling charging of sample and scanning electron microscopeFUKAYA RITSUO·Filed 2009·Granted Jul 16, 2013·0 cites·7 claims
- 2140US8692197B2Scanning electron microscope optical condition setting method and scanning electron microscopeWANG ZHIGANG·Filed 2011·Granted Apr 8, 2014·0 cites·4 claims
- 2238US2001011981A1Active matrix addressed liquid crystal display deviceFiled 2001·Application pending·0 cites
- 2332US2012126119A1Charged-Particle-Beam DeviceFUKAYA RITSUO·Filed 2010·Application pending·0 cites
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