Inventor · disambiguated record

Dimitry Shur

Also filed as: SHUR DIMITRY

1 granted patent·46 citations·filing 2003–2003

48Inventor score

Technology areasH10W

Files withAPPLIED MATERIALS ISRAEL LTD1

Top patents by PatentIndex Score

1 record

0181US7842933B2System and method for measuring overlay errorsAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Nov 30, 2010·46 cites·8 claims

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