Inventor · disambiguated record
Masakazu Aono
Also filed as: AONO MASAKAZU
23 granted patents·322 citations·filing 1990–2014
95Inventor score
Files withJAPAN SCIENCE & TECH AGENCY4JAPAN SCIENCE & TECH CORP4RIKEN4HASEGAWA TSUYOSHI2MITSUI MINING & SMELTING CO2
Top patents by PatentIndex Score
23 records- 0196US7525410B2Point contact array, not circuit, and electronic circuit using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Apr 28, 2009·50 cites·4 claims
- 0294US7026911B2Point contact array, not circuit, and electronic circuit comprising the sameRIKEN·Filed 2001·Granted Apr 11, 2006·73 cites·10 claims
- 0392US7473982B2Point contact array, not circuit, and electronic circuit comprising the sameJAPAN SCIENCE & TECH AGENCY·Filed 2004·Granted Jan 6, 2009·56 cites·3 claims
- 0479US9506822B2Double-side-coated surface stress sensorNAT INST FOR MATERIALS SCIENCE·Filed 2013·Granted Nov 29, 2016·4 cites·16 claims
- 0575US5187327ASuperconducting magnetic shieldMITSUI MINING & SMELTING CO·Filed 1990·Granted Feb 16, 1993·36 cites·2 claims
- 0668US6833719B2Apparatus for evaluating electrical characteristicsJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Dec 21, 2004·15 cites·7 claims
- 0766US8193499B2Surface enhanced infrared absorption sensor and method for producing the sameNAGAO TADAAKI·Filed 2008·Granted Jun 5, 2012·4 cites·3 claims
- 0866US7241994B2Scanning probe microscope and specimen surface structure measuring methodRIKEN·Filed 2003·Granted Jul 10, 2007·14 cites·7 claims
- 0963US5166521AIon-scattering spectrometerSHIMADZU CORP·Filed 1991·Granted Nov 24, 1992·18 cites·13 claims
- 1058US7750332B2Solid electrolyte switching device, FPGA using same, memory device, and method for manufacturing solid electrolyte switching deviceJAPAN SCIENCE & TECH AGENCY·Filed 2003·Granted Jul 6, 2010·11 cites·17 claims
- 1157US5418512ASuperconducting magnetic shieldMITSUI MINING & SMELTING CO·Filed 1992·Granted May 23, 1995·16 cites·1 claims
- 1256US8320154B2Switching element and application of the sameHASEGAWA TSUYOSHI·Filed 2008·Granted Nov 27, 2012·1 cites·10 claims
- 1352US9627499B2Electrical conduction element, electronic device, and method for operating electrical conduction elementNAT INST FOR MATERIALS SCIENCE·Filed 2014·Granted Apr 18, 2017·0 cites·15 claims
- 1448US6891186B2Electronic device having controllable conductanceJAPAN SCIENCE & TECH CORP·Filed 2001·Granted May 10, 2005·3 cites·20 claims
- 1548US6707070B2Wavelength-tunable light emitting deviceRIKEN·Filed 2002·Granted Mar 16, 2004·1 cites·8 claims
- 1646US7770232B2Scanning probe microscope systemRIKEN·Filed 2006·Granted Aug 3, 2010·1 cites·12 claims
- 1745US7875883B2Electric device using solid electrolyteJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted Jan 25, 2011·4 cites·11 claims
- 1841US6608306B1Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structureJAPAN SCIENCE & TECH CORP·Filed 1999·Granted Aug 19, 2003·8 cites·5 claims
- 1939US8601610B2Optical electric field enhancement element and probe using the sameSHINGAYA YOSHITAKA·Filed 2008·Granted Dec 3, 2013·0 cites·12 claims
- 2039US6656662B1Method of forming a polymer molecule chainJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Dec 2, 2003·3 cites·21 claims
- 2131US8896033B2Electrochemical transistorHASEGAWA TSUYOSHI·Filed 2011·Granted Nov 25, 2014·0 cites·15 claims
- 2228US5808311AMethod for detecting displacement of atoms on material surface and method for local supply of heteroatomsJAPAN RES DEV CORP·Filed 1995·Granted Sep 15, 1998·4 cites·4 claims
- 2320US6448554B1Ion scattering spectrometerRIKAGAKU KENKYUSHO·Filed 1999·Granted Sep 10, 2002·0 cites·12 claims
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