Inventor · disambiguated record
Tomonobu Nakayama
Also filed as: NAKAYAMA TOMONOBU
15 granted patents·298 citations·filing 1990–2013
94Inventor score
Files withJAPAN SCIENCE & TECH AGENCY4JAPAN SCIENCE & TECH CORP3MITSUI MINING & SMELTING CO2RIKEN2NAGAO TADAAKI1
Top patents by PatentIndex Score
15 records- 0196US7525410B2Point contact array, not circuit, and electronic circuit using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Apr 28, 2009·50 cites·4 claims
- 0294US7026911B2Point contact array, not circuit, and electronic circuit comprising the sameRIKEN·Filed 2001·Granted Apr 11, 2006·73 cites·10 claims
- 0392US7473982B2Point contact array, not circuit, and electronic circuit comprising the sameJAPAN SCIENCE & TECH AGENCY·Filed 2004·Granted Jan 6, 2009·56 cites·3 claims
- 0479US9506822B2Double-side-coated surface stress sensorNAT INST FOR MATERIALS SCIENCE·Filed 2013·Granted Nov 29, 2016·4 cites·16 claims
- 0575US5187327ASuperconducting magnetic shieldMITSUI MINING & SMELTING CO·Filed 1990·Granted Feb 16, 1993·36 cites·2 claims
- 0668US6833719B2Apparatus for evaluating electrical characteristicsJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Dec 21, 2004·15 cites·7 claims
- 0766US8193499B2Surface enhanced infrared absorption sensor and method for producing the sameNAGAO TADAAKI·Filed 2008·Granted Jun 5, 2012·4 cites·3 claims
- 0866US7241994B2Scanning probe microscope and specimen surface structure measuring methodRIKEN·Filed 2003·Granted Jul 10, 2007·14 cites·7 claims
- 0961US8141168B2Scanning probe microscope and a method to measure relative-position between probesNAKAYAMA TOMONOBU·Filed 2007·Granted Mar 20, 2012·4 cites·10 claims
- 1058US7750332B2Solid electrolyte switching device, FPGA using same, memory device, and method for manufacturing solid electrolyte switching deviceJAPAN SCIENCE & TECH AGENCY·Filed 2003·Granted Jul 6, 2010·11 cites·17 claims
- 1157US5418512ASuperconducting magnetic shieldMITSUI MINING & SMELTING CO·Filed 1992·Granted May 23, 1995·16 cites·1 claims
- 1248US6891186B2Electronic device having controllable conductanceJAPAN SCIENCE & TECH CORP·Filed 2001·Granted May 10, 2005·3 cites·20 claims
- 1345US7875883B2Electric device using solid electrolyteJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted Jan 25, 2011·4 cites·11 claims
- 1441US6608306B1Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structureJAPAN SCIENCE & TECH CORP·Filed 1999·Granted Aug 19, 2003·8 cites·5 claims
- 1539US8601610B2Optical electric field enhancement element and probe using the sameSHINGAYA YOSHITAKA·Filed 2008·Granted Dec 3, 2013·0 cites·12 claims
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