Inventor · disambiguated record
Naoaki Sugimura
Also filed as: SUGIMURA NAOAKI
33 granted patents·1 pending application·306 citations·filing 1998–2024
96Inventor score
Files withLAPIS SEMICONDUCTOR CO LTD14OKI ELECTRIC IND CO LTD11OKI SEMICONDUCTOR CO LTD4SUGIMURA NAOAKI4C/O LAPIS SEMICONDUCTOR CO LTD1
Top patents by PatentIndex Score
34 records- 0197US11719756B2Battery monitoring system and semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2021·Granted Aug 8, 2023·3 cites·4 claims
- 0296US6297687B1Drive control circuit of charged pump circuitOKI ELECTRIC IND CO LTD·Filed 1999·Granted Oct 2, 2001·152 cites·14 claims
- 0393US2024361399A1Battery monitoring system and semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2024·Application pending·0 cites
- 0486US10330736B2Semiconductor device, battery monitoring system, and diagnostic method for semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Jun 25, 2019·3 cites·11 claims
- 0582US12055598B2Battery monitoring system and semiconductor deviceC/O LAPIS SEMICONDUCTOR CO LTD·Filed 2023·Granted Aug 6, 2024·0 cites·5 claims
- 0681US10502795B2Battery monitoring system and semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Dec 10, 2019·1 cites·8 claims
- 0780US6998902B2Bandgap reference voltage circuitOKI ELECTRIC IND CO LTD·Filed 2002·Granted Feb 14, 2006·29 cites·9 claims
- 0879US11073569B2Battery monitoring system and semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2019·Granted Jul 27, 2021·0 cites·7 claims
- 0975US9966768B2Semiconductor device and battery voltage measuring method that prevents measurement error caused by parametric capacitanceLAPIS SEMICONDUCTOR CO LTD·Filed 2015·Granted May 8, 2018·2 cites·4 claims
- 1075US9103890B2Semiconductor circuit, battery monitoring system, and diagnosis methodLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Aug 11, 2015·3 cites·10 claims
- 1175US6473338B2Analog voltage supply circuit for a non-volatile memoryOKI ELECTRIC IND CO LTD·Filed 2001·Granted Oct 29, 2002·23 cites·8 claims
- 1273US6456154B2Drive control circuit of charged pump circuitOKI ELECTRIC IND CO LTD·Filed 2001·Granted Sep 24, 2002·24 cites·6 claims
- 1371US9575129B2Battery monitoring system and semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Feb 21, 2017·1 cites·10 claims
- 1471US8922169B2Semiconductor circuit, battery cell monitoring system, computer readable medium storing diagnostic program and diagnostic methodSUGIMURA NAOAKI·Filed 2012·Granted Dec 30, 2014·4 cites·9 claims
- 1569US6870351B2Voltage regulator circuit and integrated circuit device including the sameOKI ELECTRIC IND CO LTD·Filed 2003·Granted Mar 22, 2005·18 cites·17 claims
- 1662US9857432B2Battery monitoring system, semiconductor circuit, line-breakage detection program, and line-breakage detection methodLAPIS SEMICONDUCTOR CO LTD·Filed 2014·Granted Jan 2, 2018·1 cites·23 claims
- 1761US10930981B2Semiconductor device and battery monitoring systemLAPIS SEMICONDUCTOR CO LTD·Filed 2020·Granted Feb 23, 2021·0 cites·4 claims
- 1860US8930159B2Semiconductor circuit, semiconductor device, line break detection method, and computer readable medium storing line break detection programSUGIMURA NAOAKI·Filed 2012·Granted Jan 6, 2015·1 cites·12 claims
- 1958US9160177B2Semiconductor circuit, battery monitoring system, and control methodSUGIMURA NAOAKI·Filed 2012·Granted Oct 13, 2015·1 cites·11 claims
- 2056US10693301B2Semiconductor device and battery voltage measuring method that prevents measurement error caused by parametric capacitanceLAPIS SEMICONDUCTOR CO LTD·Filed 2018·Granted Jun 23, 2020·0 cites·4 claims
- 2156US6882199B2Voltage sensing circuitOKI ELECTRIC IND CO LTD·Filed 2003·Granted Apr 19, 2005·9 cites·20 claims
- 2256US5930129APower on reset circuitOKI ELECTRIC IND CO LTD·Filed 1998·Granted Jul 27, 1999·14 cites·15 claims
- 2355US7362160B2Fuse trimming circuitOKI ELECTRIC IND CO LTD·Filed 2006·Granted Apr 22, 2008·3 cites·7 claims
- 2454US10247785B2Assembled-battery system, semiconductor circuit, and diagnostic methodLAPIS SEMICONDUCTOR CO LTD·Filed 2014·Granted Apr 2, 2019·0 cites·6 claims
- 2551US10705148B2Semiconductor device and battery monitoring systemLAPIS SEMICONDUCTOR CO LTD·Filed 2018·Granted Jul 7, 2020·0 cites·8 claims
- 2651US7403045B2Comparator circuit with reduced switching noiseOKI ELECTRIC IND CO LTD·Filed 2006·Granted Jul 22, 2008·2 cites·2 claims
- 2751US6963246B2Wideband amplifierOKI ELECTRIC IND CO LTD·Filed 2003·Granted Nov 8, 2005·6 cites·6 claims
- 2849US7638996B2Reference current generator circuitOKI SEMICONDUCTOR CO LTD·Filed 2007·Granted Dec 29, 2009·2 cites·12 claims
- 2944US6469477B2Power-on reset circuitOKI ELECTRIC IND CO LTD·Filed 2002·Granted Oct 22, 2002·4 cites·16 claims
- 3043US10401434B2Semiconductor device, battery monitoring device, and voltage detection method of battery cellLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Sep 3, 2019·0 cites·9 claims
- 3141US9520775B2Boosting system, diagnosing method, and computer readable medium storing diagnosing program for diagnosing the boosting functions of a boosting sectionSUGIMURA NAOAKI·Filed 2012·Granted Dec 13, 2016·0 cites·18 claims
- 3240US7852062B2Reference current generating apparatusOKI SEMICONDUCTOR CO LTD·Filed 2008·Granted Dec 14, 2010·0 cites·9 claims
- 3340US7633281B2Reference current circuit for adjusting its output current at a low power-supply voltageOKI SEMICONDUCTOR CO LTD·Filed 2008·Granted Dec 15, 2009·0 cites·8 claims
- 3439US7956784B2DA converter including conversion amplifier having output voltage with improved linearityOKI SEMICONDUCTOR CO LTD·Filed 2009·Granted Jun 7, 2011·0 cites·19 claims
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