Inventor

GUNJI KATSUHIRO

JP2 patents

Patents

2 patents

US8432176B2Apr 30, 2013

Apparatus and method for testing semiconductor devices

GUNJI KATSUHIRO5 citations67

US8446160B2May 21, 2013

Probe card maintenance method which adjusts position/posture of probes

GUNJI KATSUHIRO3 citations51