Inventor · disambiguated record

Chang-Hai Sung

Also filed as: SUNG CHANG-HAI

1 granted patent·3 citations·filing 2008–2008

20Inventor score

Technology areasG01N

Files withIND TECH RES INST1

Top patents by PatentIndex Score

1 record

0168US7872741B2Method and apparatus for scatterfield microscopical measurementIND TECH RES INST·Filed 2008·Granted Jan 18, 2011·3 cites·2 claims

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