Inventor · disambiguated record
Jody Vanhorn
Also filed as: VANHORN JODY · VANHORN JODY JOHN
3 granted patents·1 pending application·76 citations·filing 1995–2008
74Inventor score
Files withIBM4
Top patents by PatentIndex Score
4 records- 0179US5923181AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1997·Granted Jul 13, 1999·41 cites·7 claims
- 0271US5686843AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1995·Granted Nov 11, 1997·30 cites·29 claims
- 0358US7428675B2Testing using independently controllable voltage islandsIBM·Filed 2003·Granted Sep 23, 2008·5 cites·18 claims
- 0453US2008284459A1Testing Using Independently Controllable Voltage IslandsIBM·Filed 2008·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →