Inventor · disambiguated record
Chien-Ming Lan
Also filed as: LAN CHIEN-MING
3 granted patents·32 citations·filing 2005–2012
63Inventor score
Top patents by PatentIndex Score
3 records- 0187US7456479B2Method for fabricating a probing pad of an integrated circuit chipUNITED MICROELECTRONICS CORP·Filed 2005·Granted Nov 25, 2008·31 cites·11 claims
- 0252US7741198B2Method for fabricating a probing pad of an integrated circuit chipUNITED MICROELECTRONICS CORP·Filed 2008·Granted Jun 22, 2010·1 cites·22 claims
- 0345US9075103B2Test structure for wafer acceptance test and test process for probecard needlesWU QIONG·Filed 2012·Granted Jul 7, 2015·0 cites·15 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →