Inventor · disambiguated record
Masanari Nakashima
Also filed as: NAKASHIMA MASANARI
1 granted patent·2 pending applications·9 citations·filing 2004–2004
32Inventor score
Files withJAPAN ELECTRONIC MATERIALS1
Top patents by PatentIndex Score
3 records- 0158US7081766B2Probe card for examining semiconductor devices on semiconductor wafersJAPAN ELECTRONIC MATERIALS·Filed 2004·Granted Jul 25, 2006·9 cites·18 claims
- 0227US2005093559A1Connection pinFiled 2004·Application pending·0 cites
- 0320US2005036374A1Probe card substrateFiled 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →