Inventor · disambiguated record

Yoav Many

Also filed as: MANY YOAV

1 granted patent·42 citations·filing 2003–2003

47Inventor score

Technology areasG01B

Files withNOVA MEASURING INSTR LTD1

Top patents by PatentIndex Score

1 record

0182US6815947B2Method and system for thickness measurements of thin conductive layersNOVA MEASURING INSTR LTD·Filed 2003·Granted Nov 9, 2004·42 cites·41 claims

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