Inventor · disambiguated record

Nai-Lun Chang

Also filed as: CHANG NAI-LUN

1 granted patent·16 citations·filing 1997–1997

37Inventor score

Technology areasG03F

Files withWINBOND ELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0149US5847818ACD vernier apparatus for SEM CD measurementWINBOND ELECTRONICS CORP·Filed 1997·Granted Dec 8, 1998·16 cites·9 claims

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