Inventor · disambiguated record

Weng Yew Kok

Also filed as: KOK WENG YEW

1 granted patent·4 citations·filing 2012–2012

25Inventor score

Technology areasG01R

Files withXUE MING1

Top patents by PatentIndex Score

1 record

0170US9250293B2Capacitive test device and method for capacitive testing a componentXUE MING·Filed 2012·Granted Feb 2, 2016·4 cites·21 claims

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