Inventor · disambiguated record
Ta-Lee Yu
Also filed as: YU TA-LEE
91 granted patents·5 pending applications·2,335 citations·filing 1995–2011
99Inventor score
Files withWINBOND ELECTRONICS CORP52TAIWAN SEMICONDUCTOR MFG29SEMICONDUCTOR MFG INT SHANGHAI6WINDBOND ELECTRONICS CORP3LIU CHI KANG2
Top patents by PatentIndex Score
96 records- 0195US5856214AMethod of fabricating a low voltage zener-triggered SCR for ESD protection in integrated circuitsWINBOND ELECTRONICS CORP·Filed 1996·Granted Jan 5, 1999·140 cites·9 claims
- 0294US5631793ACapacitor-couple electrostatic discharge protection circuitWINBOND ELECTRONICS CORP·Filed 1995·Granted May 20, 1997·142 cites·11 claims
- 0393US6555458B1Fabricating an electrical metal fuseTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 29, 2003·78 cites·12 claims
- 0492US5946175ASecondary ESD/EOS protection circuitWINBOND ELECTRONICS CORP·Filed 1998·Granted Aug 31, 1999·78 cites·16 claims
- 0591US5714784AElectrostatic discharge protection deviceWINBOND ELECTRONICS CORP·Filed 1995·Granted Feb 3, 1998·90 cites·9 claims
- 0690US6507087B1Silicide agglomeration poly fuse deviceTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jan 14, 2003·50 cites·23 claims
- 0789US6605493B1Silicon controlled rectifier ESD structures with trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Aug 12, 2003·46 cites·11 claims
- 0889US6580145B2Low programming voltage anti-fuse structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jun 17, 2003·56 cites·7 claims
- 0989US5838050AHexagon CMOS deviceWINBOND ELECTRONICS CORP·Filed 1997·Granted Nov 17, 1998·83 cites·10 claims
- 1089US5742084APunchthrough-triggered ESD protection circuit through gate-couplingWINBOND ELECTRONICS CORP·Filed 1996·Granted Apr 21, 1998·82 cites·22 claims
- 1188US6642088B1Silicon-controlled rectifier structures on silicon-on insulator with shallow trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 4, 2003·42 cites·24 claims
- 1288US6472286B1Bipolar ESD protection structureTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Oct 29, 2002·31 cites·7 claims
- 1388US6436738B1Silicide agglomeration poly fuse deviceTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Aug 20, 2002·45 cites·11 claims
- 1487US6803789B1High voltage tolerant output bufferSEMICONDUCTOR MFG INT CORP·Filed 2002·Granted Oct 12, 2004·42 cites·19 claims
- 1587US6433979B1Electrostatic discharge protection device using semiconductor controlled rectifierTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Aug 13, 2002·44 cites·26 claims
- 1683US6720622B1SCR-ESD structures with shallow trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 13, 2004·28 cites·7 claims
- 1783US5869873AElectrostatic discharge protection circuit having epromWINBOND ELECTRONICS CORP·Filed 1998·Granted Feb 9, 1999·54 cites·12 claims
- 1882US8891213B2Integrated electrostatic discharge (ESD) deviceLIU CHI KANG·Filed 2011·Granted Nov 18, 2014·5 cites·13 claims
- 1982US6891230B2Bipolar ESD protection structureTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted May 10, 2005·19 cites·31 claims
- 2081US6537868B1Method for forming novel low leakage current cascaded diode structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Mar 25, 2003·24 cites·19 claims
- 2179US8817435B2Integrated electrostatic discharge (ESD) deviceLIU CHI KANG·Filed 2011·Granted Aug 26, 2014·4 cites·13 claims
- 2277US6987303B2Silicon-controlled rectifier structures on silicon-on insulator with shallow trench isolationTAIWAN SEMICONDCUTOR MFG CO LT·Filed 2003·Granted Jan 17, 2006·22 cites·8 claims
- 2377US6737682B1High voltage tolerant and low voltage triggering floating-well silicon controlled rectifier on silicon-on-insulator for input or outputTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted May 18, 2004·22 cites·20 claims
- 2477US6466423B1Electrostatic discharge protection device for mixed voltage applicationTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Oct 15, 2002·23 cites·12 claims
- 2577US6031405AESD protection circuit immune to latch-up during normal operationWINBOND ELECTRONICS CORP·Filed 1998·Granted Feb 29, 2000·39 cites·11 claims
- 2676US6872987B2Silicon controlled rectifier ESD structures with trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Mar 29, 2005·18 cites·31 claims
- 2776US6476422B1Electrostatic discharge protection circuit with silicon controlled rectifier characteristicsTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Nov 5, 2002·22 cites·7 claims
- 2876US6353237B1ESD protection circuit triggered by diodeWINBOND ELECTRONICS CORP·Filed 1999·Granted Mar 5, 2002·38 cites·5 claims
- 2975US7239186B2System and method for power-on control of input/output driversSEMICONDUCTOR MFG INT SHANGHAI·Filed 2005·Granted Jul 3, 2007·8 cites·20 claims
- 3075US6473282B1Latch-up protection circuit for integrated circuits biased with multiple power supplies and its methodWINBOND ELECTRONICS CORP·Filed 2000·Granted Oct 29, 2002·21 cites·23 claims
- 3175US6444503B1Fabricating electrical metal fuses without additional maskingTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Sep 3, 2002·21 cites·48 claims
- 3274US6867103B1Method of fabricating an ESD device on SOITAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 15, 2005·19 cites·16 claims
- 3374US5831316AMulti-finger MOS transistor elementWINBOND ELECTRONICS CORP·Filed 1997·Granted Nov 3, 1998·38 cites·9 claims
- 3474US5777368AElectrostatic discharge protection device and its method of fabricationWINBOND ELECTRONICS CORP·Filed 1996·Granted Jul 7, 1998·38 cites·10 claims
- 3574US5751042AInternal ESD protection circuit for semiconductor devicesWINBOND ELECTRONICS CORP·Filed 1996·Granted May 12, 1998·35 cites·9 claims
- 3673US6542346B1High-voltage tolerance input buffer and ESD protection circuitWINBOND ELECTRONICS CORP·Filed 2000·Granted Apr 1, 2003·19 cites·10 claims
- 3773US6501137B1Electrostatic discharge protection circuit triggered by PNP bipolar actionWINBOND ELECTRONICS CORP·Filed 2000·Granted Dec 31, 2002·17 cites·13 claims
- 3873US5962876ALow voltage triggering electrostatic discharge protection circuitWINBOND ELECTRONICS CORP·Filed 1998·Granted Oct 5, 1999·33 cites·20 claims
- 3973US5880488ASegmented silicon-control-rectifier (SCR) electrostatic discharge (ESD) protection circuitWINDBOND ELECTRONICS CORP·Filed 1996·Granted Mar 9, 1999·33 cites·11 claims
- 4071US6674622B1Dynamic floating SCR (semiconductor-controlled-rectifier) ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jan 6, 2004·15 cites·27 claims
- 4171US5995354AElectrostatic discharge protection circuit for recording electrostatic discharge eventWINBOND ELECTRONICS CORP·Filed 1998·Granted Nov 30, 1999·30 cites·7 claims
- 4270US6815821B2Method of fabricating seal-ring structure with ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 9, 2004·16 cites·4 claims
- 4370US6756642B2Integrated circuit having improved ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 29, 2004·15 cites·13 claims
- 4470US6147369ASCR and current divider structure of electrostatic discharge protective circuitWINBOND ELECTRONICS CORP·Filed 1998·Granted Nov 14, 2000·32 cites·12 claims
- 4570US5742085ALow-voltage trigger electrostatic discharge protection circuitWINBOND ELECTRONICS CORP·Filed 1996·Granted Apr 21, 1998·29 cites·4 claims
- 4669US6888201B2Bipolar ESD protection structureTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted May 3, 2005·9 cites·13 claims
- 4769US6762439B1Diode for power protectionTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jul 13, 2004·14 cites·20 claims
- 4869US5889309AElectrostatic discharge protection circuitWINDBOND ELECTRONICS CORP·Filed 1996·Granted Mar 30, 1999·33 cites·11 claims
- 4968US6720625B2Bipolar ESD protection structureTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 13, 2004·9 cites·17 claims
- 5068US6410965B1Annular SCR deviceWINBOND ELECTRONICS CORP·Filed 2000·Granted Jun 25, 2002·13 cites·14 claims
Showing the top 50 of 96 patent records by PatentIndex Score.
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