Inventor · disambiguated record
Stojan Kanev
Also filed as: KANEV STOJAN
37 granted patents·11 pending applications·154 citations·filing 2004–2025
97Inventor score
Files withSUSS MICROTEC TEST SYS GMBH18MPI CORP14CASCADE MICROTECH INC5KANEV STOJAN3KIESEWETTER JOERG2
Top patents by PatentIndex Score
48 records- 0194US7332923B2Test probe for high-frequency measurementSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Feb 19, 2008·33 cites·18 claims
- 0290US11144198B2Control method of touch display apparatusMPI CORP·Filed 2019·Granted Oct 12, 2021·7 cites·13 claims
- 0384US8497693B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberKIESEWETTER JOERG·Filed 2008·Granted Jul 30, 2013·12 cites·16 claims
- 0480US8240650B2Chuck with triaxial constructionTEICH MICHAEL·Filed 2008·Granted Aug 14, 2012·8 cites·16 claims
- 0580US7733108B2Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 8, 2010·9 cites·14 claims
- 0676US7579849B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·8 cites·11 claims
- 0774US9110131B2Method and device for contacting a row of contact areas with probe tipsDIETRICH CLAUS·Filed 2010·Granted Aug 18, 2015·5 cites·19 claims
- 0873US8692567B2Method for verifying a test substrate in a prober under defined thermal conditionsTEICH MICHAEL·Filed 2009·Granted Apr 8, 2014·6 cites·16 claims
- 0973US8344744B2Probe station for on-wafer-measurement under EMI-shieldingCASCADE MICROTECH INC·Filed 2010·Granted Jan 1, 2013·3 cites·9 claims
- 1072US11036390B2Display method of display apparatusMPI CORP·Filed 2019·Granted Jun 15, 2021·1 cites·8 claims
- 1172US8278951B2Probe station for testing semiconductor substrates and comprising EMI shieldingKANEV STOJAN·Filed 2007·Granted Oct 2, 2012·8 cites·12 claims
- 1270US9194885B2Modular prober and method for operating sameKANEV STOJAN·Filed 2011·Granted Nov 24, 2015·3 cites·11 claims
- 1368US2025102539A1Probe system and machine apparatus thereofMPI CORP·Filed 2024·Application pending·0 cites
- 1467US7999563B2Chuck for supporting and retaining a test substrate and a calibration substrateCASCADE MICROTECH INC·Filed 2009·Granted Aug 16, 2011·5 cites·19 claims
- 1565US2025237696A1Probe system, method of utilizing probe system, method of testing unpackaged semiconductor device, method of producing tested semiconductor device and tested semiconductor deviceMPI CORP·Filed 2025·Application pending·0 cites
- 1663US7859278B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Dec 28, 2010·4 cites·15 claims
- 1763US7652491B2Probe support with shield for the examination of test substrates under use of probe supportsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jan 26, 2010·4 cites·12 claims
- 1862US12196779B2Probe system and machine apparatus thereofMPI CORP·Filed 2022·Granted Jan 14, 2025·0 cites·17 claims
- 1962US8922229B2Method for measurement of a power deviceHIRSCHFELD BOTHO·Filed 2010·Granted Dec 30, 2014·2 cites·19 claims
- 2062US7579854B2Probe station and method for measurements of semiconductor devices under defined atmosphereSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·4 cites·21 claims
- 2162US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 2259US11262401B2Wafer probe stationMPI CORP·Filed 2020·Granted Mar 1, 2022·0 cites·11 claims
- 2359US7741860B2Prober for testing magnetically sensitive componentsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 22, 2010·4 cites·12 claims
- 2459US7659743B2Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a waferSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Feb 9, 2010·3 cites·7 claims
- 2558US2025191946A1Probe system, method for wafer test management system in a probe system, and non-transitory computer-readable medium thereofMPI CORP·Filed 2024·Application pending·0 cites
- 2657US8402848B2Probe holderKIESEWETTER JOERG·Filed 2008·Granted Mar 26, 2013·3 cites·7 claims
- 2755US9632108B2Method for verifying a test substrate in a prober under defined thermal conditionsCASCADE MICROTECH INC·Filed 2014·Granted Apr 25, 2017·0 cites·22 claims
- 2855US7560942B2Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatusSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jul 14, 2009·2 cites·18 claims
- 2955US2024219427A1Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor deviceMPI CORP·Filed 2024·Application pending·0 cites
- 3054US9395411B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberCASCADE MICROTECH INC·Filed 2013·Granted Jul 19, 2016·0 cites·9 claims
- 3152US11287475B2Method for compensating to distance between probe tip and device under test after temperature changesMPI CORP·Filed 2020·Granted Mar 29, 2022·0 cites·7 claims
- 3252US7768271B2Method for calibration of a vectorial network analyzer having more than two portsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·8 claims
- 3352US7769555B2Method for calibration of a vectorial network analyzerSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·7 claims
- 3451US8368413B2Method for testing electronic components of a repetitive pattern under defined thermal conditionsKANEV STOJAN·Filed 2009·Granted Feb 5, 2013·2 cites·12 claims
- 3550US7573283B2Method for measurement of a device under testSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Granted Aug 11, 2009·3 cites·15 claims
- 3649US10895587B2Wafer probe stationMPI CORP·Filed 2018·Granted Jan 19, 2021·0 cites·13 claims
- 3749US10096505B2Wafer cassetteMPI CORP·Filed 2017·Granted Oct 9, 2018·0 cites·7 claims
- 3848US10312123B2Method for compensating probe misplacement and probe apparatusMPI CORP·Filed 2017·Granted Jun 4, 2019·0 cites·5 claims
- 3946US2009049944A1Micromanipulator for moving a probeSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 4045US2010106439A1Process for measuring the impedance of electronic circuitsSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 4143US9373533B2Systems and methods for providing wafer access in a wafer processing systemCASCADE MICROTECH INC·Filed 2013·Granted Jun 21, 2016·0 cites·20 claims
- 4243US8680879B2Chuck for supporting and retaining a test substrate and a calibration substrateRUMIANTSEV ANDREJ·Filed 2011·Granted Mar 25, 2014·0 cites·23 claims
- 4343US2009021275A1Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 4442US10048844B2Operating method for inspecting equipmentMPI CORP·Filed 2016·Granted Aug 14, 2018·0 cites·15 claims
- 4542US2008281537A1Process for Measuring the Impedance of Electronic CircuitsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 4640US2010029022A1Method for improved utilization of semiconductor materialSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 4739US2009314051A1Method for determination of electrical properties of electronic componets and method for calibration of a measuring unitSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 4832US2017018068A1Probe deviceMPI CORP·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →