Inventor · disambiguated record
Uwe Schmalzbauer
Also filed as: SCHMALZBAUER UWE
11 granted patents·2 pending applications·39 citations·filing 2007–2021
86Inventor score
Files withINFINEON TECHNOLOGIES AG8INFINEON TECHNOLOGIES AUSTRIA2HIRLER FRANZ1NELLE PETER1ZUNDEL MARKUS1
Top patents by PatentIndex Score
13 records- 0188US8084865B2Anchoring structure and intermeshing structureHIRLER FRANZ·Filed 2008·Granted Dec 27, 2011·17 cites·13 claims
- 0283US8803297B2Semiconductor device including a stress relief layer and method of manufacturingNELLE PETER·Filed 2012·Granted Aug 12, 2014·7 cites·16 claims
- 0376US9218960B2Method of manufacturing a semiconductor device including a stress relief layerINFINEON TECHNOLOGIES AG·Filed 2014·Granted Dec 22, 2015·3 cites·7 claims
- 0474US7800171B2Integrated circuit including a semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA·Filed 2007·Granted Sep 21, 2010·6 cites·12 claims
- 0569US7939885B2Semiconductor device and method of manufacturing a semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA·Filed 2008·Granted May 10, 2011·4 cites·17 claims
- 0668US9171777B2Semiconductor device and method for manufacturing a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2013·Granted Oct 27, 2015·2 cites·14 claims
- 0753US9343381B2Semiconductor component with integrated crack sensor and method for detecting a crack in a semiconductor componentINFINEON TECHNOLOGIES AG·Filed 2013·Granted May 17, 2016·0 cites·18 claims
- 0850US11804432B2Semiconductor device with polymer-based insulating material and method of producing thereofINFINEON TECHNOLOGIES AG·Filed 2021·Granted Oct 31, 2023·0 cites·20 claims
- 0948US9570433B2Semiconductor device and method for manufacturing a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2015·Granted Feb 14, 2017·0 cites·20 claims
- 1046US8933448B2Wafers and chips comprising test structuresZUNDEL MARKUS·Filed 2012·Granted Jan 13, 2015·0 cites·24 claims
- 1146US2016254200A1Method for Detecting a Crack in a Semiconductor Body of a Semiconductor ComponentINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
- 1245US11810958B2Transistor component having gate electrodes and field electrodesINFINEON TECHNOLOGIES AG·Filed 2021·Granted Nov 7, 2023·0 cites·19 claims
- 1337US2014167043A1Semiconductor device and method for manufacturing a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →