Inventor · disambiguated record
Kiyotaka Ichiyama
Also filed as: ICHIYAMA KIYOTAKA
33 granted patents·4 pending applications·112 citations·filing 2004–2022
96Inventor score
Top patents by PatentIndex Score
37 records- 0187US7394277B2Testing apparatus, testing method, jitter filtering circuit, and jitter filtering methodADVANTEST CORP·Filed 2006·Granted Jul 1, 2008·14 cites·18 claims
- 0283US7496137B2Apparatus for measuring jitter and method of measuring jitterADVANTEST CORP·Filed 2005·Granted Feb 24, 2009·12 cites·20 claims
- 0379US7999531B2Phase detecting apparatus, test apparatus and adjusting methodADVANTEST CORP·Filed 2010·Granted Aug 16, 2011·4 cites·12 claims
- 0477US8000931B2Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic deviceADVANTEST CORP·Filed 2008·Granted Aug 16, 2011·7 cites·17 claims
- 0576US11005463B2Signal processor and signal processing methodADVANTEST CORP·Filed 2020·Granted May 11, 2021·1 cites·6 claims
- 0675US7903776B2Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatusADVANTEST CORP·Filed 2009·Granted Mar 8, 2011·7 cites·14 claims
- 0772US8896332B2Test apparatus with voltage margin testISHIDA MASAHIRO·Filed 2011·Granted Nov 25, 2014·2 cites·19 claims
- 0872US7715512B2Jitter measurement apparatus, jitter measurement method, and recording mediumADVANTEST CORP·Filed 2006·Granted May 11, 2010·6 cites·12 claims
- 0970US7844020B2Transmission system, transmitter, receiver, and transmission methodADVANTEST CORP·Filed 2007·Granted Nov 30, 2010·4 cites·16 claims
- 1069US8659330B2Signal generation apparatus and signal generation methodADVANTEST CORP·Filed 2013·Granted Feb 25, 2014·2 cites·9 claims
- 1169US7724811B2Delay circuit, jitter injection circuit, and test apparatusADVANTEST CORP·Filed 2006·Granted May 25, 2010·5 cites·11 claims
- 1267US7957458B2Jitter measurement apparatus, jitter measurement method, test apparatus and electronic deviceADVANTEST CORP·Filed 2006·Granted Jun 7, 2011·3 cites·18 claims
- 1367US7834639B2Jitter injection circuit, pattern generator, test apparatus, and electronic deviceADVANTEST CORP·Filed 2008·Granted Nov 16, 2010·5 cites·15 claims
- 1465US8155215B2Transmission system, transmitter, receiver, and transmission methodICHIYAMA KIYOTAKA·Filed 2007·Granted Apr 10, 2012·3 cites·7 claims
- 1565US7554332B2Calibration apparatus, calibration method, testing apparatus, and testing methodADVANTEST CORP·Filed 2006·Granted Jun 30, 2009·2 cites·34 claims
- 1663US7801211B2Communication system, receiver unit, and adaptive equalizerADVANTEST CORP·Filed 2007·Granted Sep 21, 2010·2 cites·10 claims
- 1763US7778319B2Jitter measuring apparatus, jitter measuring method and test apparatusADVANTEST CORP·Filed 2005·Granted Aug 17, 2010·4 cites·13 claims
- 1862US7945405B2Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatusADVANTEST CORP·Filed 2008·Granted May 17, 2011·3 cites·21 claims
- 1962US7904776B2Jitter injection circuit, pattern generator, test apparatus, and electronic deviceADVANTEST CORP·Filed 2008·Granted Mar 8, 2011·3 cites·33 claims
- 2060US7466140B2Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatusADVANTEST CORP·Filed 2006·Granted Dec 16, 2008·3 cites·16 claims
- 2157US8045605B2Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatusADVANTEST CORP·Filed 2006·Granted Oct 25, 2011·2 cites·7 claims
- 2257US7917331B2Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic deviceADVANTEST CORP·Filed 2008·Granted Mar 29, 2011·2 cites·14 claims
- 2357US7564897B2Jitter measuring apparatus, jitter measuring method and PLL circuitADVANTEST CORP·Filed 2004·Granted Jul 21, 2009·7 cites·15 claims
- 2457US7412341B2Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing methodADVANTEST CORP·Filed 2006·Granted Aug 12, 2008·2 cites·22 claims
- 2556US8204165B2Jitter measurement apparatus, electronic device, and test apparatusICHIYAMA KIYOTAKA·Filed 2006·Granted Jun 19, 2012·2 cites·11 claims
- 2656US7541815B2Electronic device, testing apparatus, and testing methodADVANTEST CORP·Filed 2006·Granted Jun 2, 2009·2 cites·12 claims
- 2755US8068538B2Jitter measuring apparatus, jitter measuring method and test apparatusICHIYAMA KIYOTAKA·Filed 2005·Granted Nov 29, 2011·2 cites·9 claims
- 2852US2022365553A1Measurement apparatus and measurement methodADVANTEST CORP·Filed 2022·Application pending·0 cites
- 2951US8014465B2Digital modulator, digital modulating method, digital transceiver system, and testing apparatusADVANTEST CORP·Filed 2008·Granted Sep 6, 2011·0 cites·24 claims
- 3048US7501905B2Oscillator circuit, PLL circuit, semiconductor chip, and test apparatusADVANTEST CORP·Filed 2006·Granted Mar 10, 2009·1 cites·23 claims
- 3144US7971107B2Calculation apparatus, calculation method, program, recording medium, test system and electronic deviceADVANTEST CORP·Filed 2008·Granted Jun 28, 2011·0 cites·11 claims
- 3242US9151801B2Measurement circuit and test apparatusISHIDA MASAHIRO·Filed 2011·Granted Oct 6, 2015·0 cites·13 claims
- 3342US8271219B2Deterministic component model identifying apparatus, identifying method, program, recording medium, test system and electronic deviceYAMAGUCHI TAKAHIRO·Filed 2008·Granted Sep 18, 2012·0 cites·8 claims
- 3441US2012323519A1Test apparatusISHIDA MASAHIRO·Filed 2012·Application pending·0 cites
- 3540US8175828B2Evaluation apparatus, evaluation method, program, recording medium and electronic deviceICHIYAMA KIYOTAKA·Filed 2009·Granted May 8, 2012·0 cites·12 claims
- 3640US2013170583A1Transmitting system, receiving system, transmitting method, and receiving methodICHIYAMA KIYOTAKA·Filed 2012·Application pending·0 cites
- 3735US2006087346A1Phase difference detecting apparatusADVANTEST CORP·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →