Inventor · disambiguated record
Yoshihiro Koyama
Also filed as: KOYAMA YOSHIHIRO
23 granted patents·3 pending applications·444 citations·filing 1980–2022
96Inventor score
Files withSEIKO INSTR INC6DAINIPPON SCREEN MFG5CANON KK3OGAWA TAKASHI2HITACHI HIGH TECH SCIENCE CORP1
Top patents by PatentIndex Score
26 records- 0195US7111755B2Liquid discharge method and apparatus and display device panel manufacturing method and apparatusCANON KK·Filed 2003·Granted Sep 26, 2006·82 cites·32 claims
- 0294US4746857AProbing apparatus for measuring electrical characteristics of semiconductor device formed on waferDAINIPPON SCREEN MFG·Filed 1986·Granted May 24, 1988·108 cites·11 claims
- 0391US6395347B1Micromachining method for workpiece observationSEIKO INSTR INC·Filed 1994·Granted May 28, 2002·68 cites·14 claims
- 0488US8287119B2PrinterYAMAGUCHI TOSHIAKI·Filed 2010·Granted Oct 16, 2012·7 cites·15 claims
- 0582US8822945B2Focused ion beam apparatusNISHINAKA KENICHI·Filed 2011·Granted Sep 2, 2014·9 cites·7 claims
- 0680US8336985B2Ink-jet recording apparatusHOKAZONO YUTAKA·Filed 2010·Granted Dec 25, 2012·3 cites·21 claims
- 0776US4366005ASteam washing in a dishwasherSHARP KK·Filed 1980·Granted Dec 28, 1982·44 cites·11 claims
- 0874US6891171B1Method for repairing a phase shift mask and a focused ion beam apparatus for carrying out methodSII NANOTECHNOLOGY INC·Filed 2000·Granted May 10, 2005·13 cites·30 claims
- 0973US7396199B2Substrate processing apparatus and substrate processing methodDAINIPPON SCREEN MFG·Filed 2002·Granted Jul 8, 2008·18 cites·5 claims
- 1072US6365905B1Focused ion beam processing apparatusSEIKO INSTR INC·Filed 1999·Granted Apr 2, 2002·24 cites·20 claims
- 1171US6576913B2Focused ion beam apparatus having a gas injector in which one of a plurality of nozzles can be selectively driven for elevationSEIKO INSTR INC·Filed 2002·Granted Jun 10, 2003·8 cites·13 claims
- 1270US6868302B2Thermal processing apparatusDAINIPPON SCREEN MFG·Filed 2003·Granted Mar 15, 2005·11 cites·16 claims
- 1368US6118122AIon beam working apparatusSEIKO INSTR INC·Filed 1997·Granted Sep 12, 2000·21 cites·11 claims
- 1455US9257273B2Charged particle beam apparatus, thin film forming method, defect correction method and device forming methodKOYAMA YOSHIHIRO·Filed 2011·Granted Feb 9, 2016·1 cites·15 claims
- 1553US11749493B2Liquid metal ion source and focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Sep 5, 2023·0 cites·10 claims
- 1653US6225627B1Focused ion beam systemSEIKO INSTR INC·Filed 1999·Granted May 1, 2001·10 cites·20 claims
- 1752US5200769AImage forming apparatus provided with shifting means for the toner feed meansMITA INDUSTRIAL CO LTD·Filed 1991·Granted Apr 6, 1993·11 cites·6 claims
- 1852US2013083144A1Ink-jet recording apparatusCANON KK·Filed 2012·Application pending·0 cites
- 1951US10016982B2Inkjet apparatusCANON KK·Filed 2016·Granted Jul 10, 2018·0 cites·10 claims
- 2051US2007235341A1Plating apparatus, cartridge and copper dissolution tank for use in the plating apparatus, and plating methodDAINIPPON SCREEN MFG·Filed 2007·Application pending·0 cites
- 2149US7279079B2Plating apparatus, cartridge and copper dissolution tank for use in the plating apparatus, and plating methodDAINIPPON SCREEN MFG·Filed 2003·Granted Oct 9, 2007·2 cites·9 claims
- 2245US8389953B2Focused ion beam apparatusOGAWA TAKASHI·Filed 2011·Granted Mar 5, 2013·0 cites·16 claims
- 2343US2024344640A1Air brake tubeNITTA CORP·Filed 2022·Application pending·0 cites
- 2440US6348689B1Focused ion beam apparatusSEIKO INSTR INC·Filed 1999·Granted Feb 19, 2002·4 cites·37 claims
- 2538US8513602B2Focused ion beam apparatusOGAWA TAKASHI·Filed 2010·Granted Aug 20, 2013·0 cites·14 claims
- 2624US6288770B1Apparatus and method for feeding a filmNORITSU KOKI CO LTD·Filed 1999·Granted Sep 11, 2001·0 cites·11 claims
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