Inventor · disambiguated record
Hisaaki Kanai
Also filed as: KANAI HISAAKI
12 granted patents·7 pending applications·36 citations·filing 2002–2023
86Inventor score
Top patents by PatentIndex Score
19 records- 0186US10458924B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 29, 2019·3 cites·8 claims
- 0285US9576769B2Weak signal detection system and electron microscope equipped with sameHITACHI LTD·Filed 2014·Granted Feb 21, 2017·7 cites·5 claims
- 0372US7649381B2Level conversion circuitHITACHI LTD·Filed 2007·Granted Jan 19, 2010·7 cites·4 claims
- 0468US6856709B2Optical modulation deviceOPNEXT JAPAN INC·Filed 2002·Granted Feb 15, 2005·11 cites·14 claims
- 0566US9478392B2Charged particle beam apparatus and image generation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 25, 2016·1 cites·10 claims
- 0663US7965765B2Adjustment method, circuit, receiver circuit and transmission equipment of waveform equalization coefficientHITACHI LTD·Filed 2007·Granted Jun 21, 2011·2 cites·6 claims
- 0759US7902860B2Semiconductor circuit, and computing device and communications device using the sameHITACHI LTD·Filed 2008·Granted Mar 8, 2011·4 cites·13 claims
- 0858US7772877B2Output buffer circuit, differential output buffer circuit, output buffer circuit having regulation circuit and regulation function, and transmission methodHITACHI LTD·Filed 2008·Granted Aug 10, 2010·1 cites·11 claims
- 0956US2025224342A1Optical-type foreign matter inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1053US2024044806A1Optical foreign matter inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1152US12313566B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted May 27, 2025·0 cites·12 claims
- 1251US2025237669A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 1348US2024223134A1High voltage amplifierHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1446US2007184687A1Circuit board provided with digging depth detection structure and transmission device with the same mountedKANAI HISAAKI·Filed 2007·Application pending·0 cites
- 1545US10634697B2High-sensitivity sensor system, detection circuit, and detection methodHITACHI LTD·Filed 2015·Granted Apr 28, 2020·0 cites·16 claims
- 1643US12366538B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 22, 2025·0 cites·11 claims
- 1741US2015012249A1Minute Signal Detection Method and SystemHITACHI LTD·Filed 2013·Application pending·0 cites
- 1838US2009033431A1Oscillation CircuitHITACHI LTD·Filed 2008·Application pending·0 cites
- 1936US8563925B2Mass spectroscope and its adjusting methodHITACHI HIGH TECH CORP·Filed 2012·Granted Oct 22, 2013·0 cites·14 claims
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