Inventor · disambiguated record

Yoko Irie

Also filed as: IRIE YOKO

2 granted patents·47 citations·filing 1996–1998

64Inventor score

Technology areasG06T

Files withHITACHI LTD2

Top patents by PatentIndex Score

2 records

0159US6072899AMethod and device of inspecting three-dimensional shape defectHITACHI LTD·Filed 1998·Granted Jun 6, 2000·32 cites·20 claims
0241US5930382AWiring pattern inspecting method and system for carrying out the sameHITACHI LTD·Filed 1996·Granted Jul 27, 1999·15 cites·32 claims

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Yoko Irie — Patent Inventor | PatentIndex