Inventor · disambiguated record
Kenneth G. Vickers
Also filed as: VICKERS KENNETH G
32 granted patents·621 citations·filing 1994–2003
98Inventor score
Files withTEXAS INSTRUMENTS INC32
Top patents by PatentIndex Score
32 records- 0189US5963881AMethod and system for enhancing the identification of causes of variations in the performance of manufactured articlesTEXAS INSTRUMENTS INC·Filed 1997·Granted Oct 5, 1999·130 cites·26 claims
- 0284US5621272AField emission device with over-etched gate dielectricTEXAS INSTRUMENTS INC·Filed 1995·Granted Apr 15, 1997·38 cites·12 claims
- 0382US5577943AMethod for fabricating a field emission device having black matrix SOG as an interlevel dielectricTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 26, 1996·40 cites·15 claims
- 0481US5659467AMultiple model supervisor control system and method of operationTEXAS INSTRUMENTS INC·Filed 1996·Granted Aug 19, 1997·72 cites·20 claims
- 0578US6684125B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2001·Granted Jan 27, 2004·16 cites·9 claims
- 0678US5556316AClustered field emission microtips adjacent stripe conductorsTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 17, 1996·29 cites·16 claims
- 0775US5759078AField emission device with close-packed microtip arrayTEXAS INSTRUMENTS INC·Filed 1996·Granted Jun 2, 1998·28 cites·16 claims
- 0873US5536993AClustered field emission microtips adjacent stripe conductorsTEXAS INSTRUMENTS INC·Filed 1995·Granted Jul 16, 1996·22 cites·15 claims
- 0972US6975920B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 13, 2005·11 cites·5 claims
- 1071US6862495B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 1, 2005·10 cites·4 claims
- 1167US5902165AField emission device with over-etched gate dielectricTEXAS INSTRUMENTS INC·Filed 1996·Granted May 11, 1999·16 cites·14 claims
- 1265US5666024ALow capacitance field emission device with circular microtip arrayTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 9, 1997·18 cites·25 claims
- 1365US5521660AMultimedia field emission device portable projectorTEXAS INSTRUMENTS INC·Filed 1995·Granted May 28, 1996·8 cites·4 claims
- 1464US5477284ADual mode overhead projection system using field emission deviceTEXAS INSTRUMENTS INC·Filed 1994·Granted Dec 19, 1995·10 cites·11 claims
- 1562US5830527AFlat panel display anode structure and method of makingTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 3, 1998·15 cites·38 claims
- 1660US5611719AMethod for improving flat panel display anode plate phosphor efficiencyTEXAS INSTRUMENTS INC·Filed 1995·Granted Mar 18, 1997·14 cites·16 claims
- 1760US5608285ABlack matrix sog as an interlevel dielectric in a field emission deviceTEXAS INSTRUMENTS INC·Filed 1995·Granted Mar 4, 1997·14 cites·12 claims
- 1860US5598057AReduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reductionTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 28, 1997·12 cites·6 claims
- 1958US5557159AField emission microtip clusters adjacent stripe conductorsTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 17, 1996·14 cites·54 claims
- 2057US5780960AMicro-machined field emission microtipsTEXAS INSTRUMENTS INC·Filed 1996·Granted Jul 14, 1998·12 cites·7 claims
- 2157US5635791AField emission device with circular microtip arrayTEXAS INSTRUMENTS INC·Filed 1995·Granted Jun 3, 1997·12 cites·19 claims
- 2257US5628662AMethod of fabricating a color field emission flat panel display tetrodeTEXAS INSTRUMENTS INC·Filed 1995·Granted May 13, 1997·15 cites·34 claims
- 2357US5593562AMethod for improving flat panel display anode plate phosphor efficiencyTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 14, 1997·12 cites·23 claims
- 2454US5578902AField emission display having modified anode stripe geometryTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 26, 1996·11 cites·8 claims
- 2554US5517075AField emission device with distinct sized aperturesTEXAS INSTRUMENTS INC·Filed 1995·Granted May 14, 1996·9 cites·14 claims
- 2645US6414249B1Reduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reductionTEXAS INSTRUMENTS INC·Filed 1996·Granted Jul 2, 2002·5 cites·2 claims
- 2745US5538450AMethod of forming a size-arrayed emitter matrix for use in a flat panel displayTEXAS INSTRUMENTS INC·Filed 1995·Granted Jul 23, 1996·5 cites·16 claims
- 2844US5836799ASelf-aligned method of micro-machining field emission display microtipsTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 17, 1998·5 cites·5 claims
- 2943US5938493AMethod for increasing field emission tip efficiency through micro-milling techniquesTEXAS INSTRUMENTS INC·Filed 1996·Granted Aug 17, 1999·5 cites·10 claims
- 3043US5558554AMethod for fabricating a field emission device anode plate having multiple grooves between anode conductorsTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 24, 1996·7 cites·30 claims
- 3137US5674407AMethod for selective etching of flat panel display anode plate conductorsTEXAS INSTRUMENTS INC·Filed 1995·Granted Oct 7, 1997·3 cites·17 claims
- 3236US5633120AMethod for achieving anode stripe delineation from an interlevel dielectric etch in a field emission deviceTEXAS INSTRUMENTS INC·Filed 1995·Granted May 27, 1997·3 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →