Inventor · disambiguated record
Yasuaki Takada
Also filed as: TAKADA YASUAKI
70 granted patents·7 pending applications·1,208 citations·filing 1994–2020
99Inventor score
Top patents by PatentIndex Score
77 records- 0196US5877495AMass spectrometerHITACHI LTD·Filed 1995·Granted Mar 2, 1999·99 cites·7 claims
- 0294US7129478B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 31, 2006·20 cites·16 claims
- 0393US6335525B1Mass spectrometerHITACHI LTD·Filed 2000·Granted Jan 1, 2002·36 cites·22 claims
- 0493US6252225B1Mass spectrometry of solution and apparatus thereforHITACHI LTD·Filed 2000·Granted Jun 26, 2001·35 cites·6 claims
- 0592US5481107AMass spectrometerHITACHI LTD·Filed 1994·Granted Jan 2, 1996·98 cites·43 claims
- 0690US6894276B1Probing method using ion trap mass spectrometer and probing deviceHITACHI LTD·Filed 2000·Granted May 17, 2005·27 cites·7 claims
- 0790US6121608AMass spectrometry of solution and apparatusHITACHI LTD·Filed 1997·Granted Sep 19, 2000·50 cites·102 claims
- 0890US6114693AMass spectrometer and mass spectrometry method for analyzing compounds contained in a solutionHITACHI LTD·Filed 1999·Granted Sep 5, 2000·56 cites·11 claims
- 0989US7718960B2Ion mobility spectrometer and ion-mobility-spectrometry/mass-spectrometry hybrid spectrometerHITACHI LTD·Filed 2008·Granted May 18, 2010·14 cites·15 claims
- 1089US7397025B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 8, 2008·10 cites·1 claims
- 1188US6005245AMethod and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis regionHITACHI LTD·Filed 1997·Granted Dec 21, 1999·53 cites·23 claims
- 1287US6437327B2Mass spectrometry of solution and apparatus thereforHITACHI LTD·Filed 2001·Granted Aug 20, 2002·20 cites·5 claims
- 1386US6541769B1Mass spectrometerHITACHI LTD·Filed 2000·Granted Apr 1, 2003·25 cites·17 claims
- 1486US6423965B1Mass spectrometerHITACHI LTD·Filed 1999·Granted Jul 23, 2002·46 cites·15 claims
- 1585US6147347AIon source and mass spectrometer instrument using the sameHITACHI LTD·Filed 1999·Granted Nov 14, 2000·31 cites·35 claims
- 1685US5986259AMass spectrometerHITACHI LTD·Filed 1997·Granted Nov 16, 1999·44 cites·9 claims
- 1784US8164053B2Mass analyzer and mass analyzing methodSUGIYAMA MASUYUKI·Filed 2008·Granted Apr 24, 2012·8 cites·17 claims
- 1884US8044349B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 25, 2011·7 cites·23 claims
- 1984US6316769B2Mass spectrometerHITACHI LTD·Filed 2000·Granted Nov 13, 2001·14 cites·5 claims
- 2083US9261437B2Attached matter inspection deviceHITACHI LTD·Filed 2013·Granted Feb 16, 2016·4 cites·12 claims
- 2183US6884997B2Method and apparatus for detecting dangerous substances and substances of interestHITACHI LTD·Filed 2003·Granted Apr 26, 2005·27 cites·28 claims
- 2283US6384411B1Ion source and mass spectrometer instrument using the sameHITACHI LTD·Filed 2000·Granted May 7, 2002·13 cites·4 claims
- 2383US6188065B1Mass spectrometerHITACHI LTD·Filed 1999·Granted Feb 13, 2001·31 cites·14 claims
- 2483US5663560AMethod and apparatus for mass analysis of solution sampleHITACHI LTD·Filed 1995·Granted Sep 2, 1997·42 cites·69 claims
- 2582US7057169B2Probing method using ion trap mass spectrometer and probing deviceHITACHI LTD·Filed 2005·Granted Jun 6, 2006·4 cites·9 claims
- 2681US6465779B2Mass spectrometerHITACHI LTD·Filed 2001·Granted Oct 15, 2002·11 cites·2 claims
- 2781US6157030AIon trap mass spectrometerHITACHI LTD·Filed 1998·Granted Dec 5, 2000·39 cites·21 claims
- 2880US8560249B2Dangerous substance detection systemNAGANO HISASHI·Filed 2010·Granted Oct 15, 2013·5 cites·14 claims
- 2980US6586730B1Plasma ion source mass spectrometerHITACHI LTD·Filed 2000·Granted Jul 1, 2003·17 cites·1 claims
- 3079US9696288B2Attached matter testing device and testing methodHITACHI LTD·Filed 2012·Granted Jul 4, 2017·3 cites·11 claims
- 3179US6677582B2Ion source and mass spectrometerHITACHI LTD·Filed 2001·Granted Jan 13, 2004·14 cites·9 claims
- 3279US6639215B2Ion source and mass spectrometerHITACHI LTD·Filed 2002·Granted Oct 28, 2003·14 cites·12 claims
- 3378US7408153B2Apparatus for detecting chemical substances and method thereforHITACHI LTD·Filed 2006·Granted Aug 5, 2008·3 cites·8 claims
- 3477US8217339B2Adhering matter inspection equipment and method for inspecting adhering methodKASHIMA HIDEO·Filed 2005·Granted Jul 10, 2012·5 cites·12 claims
- 3577US7829848B2Gas monitoring apparatusHITACHI LTD·Filed 2008·Granted Nov 9, 2010·4 cites·3 claims
- 3677US7820965B2Apparatus for detecting chemical substances and method thereforHITACHI LTD·Filed 2008·Granted Oct 26, 2010·6 cites·6 claims
- 3776US9417163B2Analyzer for substanceHITACHI LTD·Filed 2014·Granted Aug 16, 2016·2 cites·8 claims
- 3876US7002145B2Detection method and detection device of special drugsHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 21, 2006·11 cites·3 claims
- 3975US7829846B2Analytical system and method utilizing the dependence of signal intensity on matrix component concentrationHITACHI LTD·Filed 2008·Granted Nov 9, 2010·3 cites·17 claims
- 4075US5969351AMass spectrometerHITACHI LTD·Filed 1997·Granted Oct 19, 1999·26 cites·13 claims
- 4174US6075243AMass spectrometerHITACHI LTD·Filed 1997·Granted Jun 13, 2000·26 cites·24 claims
- 4274US5825027AMass spectrometerHITACHI LTD·Filed 1997·Granted Oct 20, 1998·17 cites·5 claims
- 4373US7078685B2Mass spectrometerHITACHI LTD·Filed 2004·Granted Jul 18, 2006·10 cites·4 claims
- 4472US7956322B2Mass spectrometer and mass spectrometric analysis methodHITACHI LTD·Filed 2009·Granted Jun 7, 2011·2 cites·14 claims
- 4572US6580067B1Sample analyzing monitor and combustion control system using the sameHITACHI LTD·Filed 2000·Granted Jun 17, 2003·17 cites·5 claims
- 4671US7449685B2Gas monitoring apparatusHITACHI LTD·Filed 2006·Granted Nov 11, 2008·6 cites·12 claims
- 4771US7015464B2Apparatus for detecting chemical substances and method thereforHITACHI LTD·Filed 2004·Granted Mar 21, 2006·6 cites·19 claims
- 4868US9423388B2Particle analyzing deviceHITACHI LTD·Filed 2013·Granted Aug 23, 2016·1 cites·15 claims
- 4967US9850696B2Microparticle detection device and security gateHITACHI LTD·Filed 2013·Granted Dec 26, 2017·4 cites·16 claims
- 5067US7164124B2Mass spectrometric apparatus and ion sourceHITACHI LTD·Filed 2004·Granted Jan 16, 2007·6 cites·20 claims
Showing the top 50 of 77 patent records by PatentIndex Score.
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