Inventor · disambiguated record
Michael Dalterio
Also filed as: DALTERIO MICHAEL · DALTERIO MICHAEL J
2 granted patents·112 citations·filing 1985–1995
67Inventor score
Top patents by PatentIndex Score
2 records- 0164US4675528AMethod for measurement of spotsize and edgewidth in electron beam lithographyCONTROL DATA CORP·Filed 1985·Granted Jun 23, 1987·24 cites·28 claims
- 0260US5635709AMethod and apparatus for measuring radiation dose distributionPHOTOELECTRON CORP·Filed 1995·Granted Jun 3, 1997·88 cites·20 claims
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