Inventor · disambiguated record

Jen-Yang Wen

Also filed as: WEN JEN-YANG

1 granted patent·0 citations·filing 2011–2011

5Inventor score

Technology areasG06F

Files withCHANG MING TUNG1

Top patents by PatentIndex Score

1 record

0131US8468407B2Method for creating test clock domain during integrated circuit design, and associated computer readable mediumCHANG MING-TUNG·Filed 2011·Granted Jun 18, 2013·0 cites·17 claims

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