Inventor · disambiguated record
David Hess
Also filed as: HESS DAVID · HESS DAVID R · HESS DAVID RANDLE
10 granted patents·2 pending applications·113 citations·filing 2003–2021
88Inventor score
Files withCASCADE MICROTECH INC5FORMFACTOR INC2JDS UNIPHASE INC2ANDREWS PETER1CASCADE MIRCOTECH INC1
Top patents by PatentIndex Score
12 records- 0191US7010188B2Electrode configuration for piano MEMs micromirrorJDS UNIPHASE INC·Filed 2005·Granted Mar 7, 2006·29 cites·16 claims
- 0288US7656172B2System for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Granted Feb 2, 2010·17 cites·12 claims
- 0387US6968101B2Electrode configuration for piano MEMs micromirrorJDS UNIPHASE INC·Filed 2004·Granted Nov 22, 2005·32 cites·15 claims
- 0482US7940069B2System for testing semiconductorsCASCADE MICROTECH INC·Filed 2009·Granted May 10, 2011·10 cites·10 claims
- 0582US7535247B2Interface for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Granted May 19, 2009·11 cites·14 claims
- 0677US7898281B2Interface for testing semiconductorsCASCADE MIRCOTECH INC·Filed 2008·Granted Mar 1, 2011·10 cites·12 claims
- 0776US10365323B2Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature changeCASCADE MICROTECH INC·Filed 2016·Granted Jul 30, 2019·2 cites·20 claims
- 0874US11016121B2Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-testFORMFACTOR INC·Filed 2019·Granted May 25, 2021·2 cites·20 claims
- 0964US11821912B2Methods of producing augmented probe system images and associated probe systemsFORMFACTOR INC·Filed 2021·Granted Nov 21, 2023·0 cites·22 claims
- 1038US2006169897A1Microscope system for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Application pending·0 cites
- 1137US9435858B2Focusing optical systems and methods for testing semiconductorsANDREWS PETER·Filed 2011·Granted Sep 6, 2016·0 cites·18 claims
- 1235US2004140343A1Vent hole sealing of hermetic packagesFiled 2003·Application pending·0 cites
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