Inventor · disambiguated record
Wayne Rademacher
Also filed as: RADEMACHER WAYNE · RADEMACHER WAYNE ALAN
3 granted patents·10 citations·filing 2005–2006
61Inventor score
Technology areasG01R
Files withAGERE SYSTEMS INC3
Top patents by PatentIndex Score
3 records- 0165US7005880B1Method of testing electronic wafers having lead-free solder contactsAGERE SYSTEMS INC·Filed 2005·Granted Feb 28, 2006·8 cites·12 claims
- 0250US7132840B2Method of electrical testingAGERE SYSTEMS INC·Filed 2005·Granted Nov 7, 2006·2 cites·9 claims
- 0336US7239160B2Method of electrical testing of an integrated circuit with an electrical probeAGERE SYSTEMS INC·Filed 2006·Granted Jul 3, 2007·0 cites·9 claims
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