Inventor · disambiguated record
Ingrid De Wolf
Also filed as: DE WOLF INGRID
8 granted patents·4 pending applications·70 citations·filing 1998–2020
85Inventor score
Top patents by PatentIndex Score
12 records- 0189US9601459B2Method for aligning micro-electronic componentsIMEC VZW·Filed 2014·Granted Mar 21, 2017·11 cites·15 claims
- 0286US9025020B2Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDESLANDES HERVE·Filed 2011·Granted May 5, 2015·14 cites·18 claims
- 0380US8294976B1Method for reducing substrate chargingDE WOLF INGRID·Filed 2009·Granted Oct 23, 2012·13 cites·14 claims
- 0478US9098892B2Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2014·Granted Aug 4, 2015·3 cites·18 claims
- 0562US6043882AEmission microscope and method for continuous wavelength spectroscopyIMEC VZW·Filed 1998·Granted Mar 28, 2000·28 cites·29 claims
- 0658US10777471B2Method of detecting manufacturing defects by thermal stimulationIMEC VZW·Filed 2018·Granted Sep 15, 2020·1 cites·19 claims
- 0750US9799632B2Method for aligning micro-electronic componentsIMEC VZW·Filed 2017·Granted Oct 24, 2017·0 cites·20 claims
- 0847US2015338458A1Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2015·Application pending·0 cites
- 0942US11362061B2Method for the electrical bonding of semiconductor componentsIMEC VZW·Filed 2020·Granted Jun 14, 2022·0 cites·22 claims
- 1038US2007040281A1Semiconductor device and method of producing the sameNAKAYAMA HIROKAZU·Filed 2006·Application pending·0 cites
- 1131US2017005018A1Method and device for inspection of a semiconductor deviceIMEC VZW·Filed 2016·Application pending·0 cites
- 1228US2017011956A1Method for Producing an Integrated Circuit Device with Enhanced Mechanical PropertiesIMEC VZW·Filed 2016·Application pending·0 cites
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